X-ray fluorescence analysis method for multi-element determination in ferroniobium
An element determination and X-ray technology, applied in the field of X-ray fluorescence analysis, can solve the problems of high cost and complicated operation process, and achieve the effect of reducing test time, simple test process and cost reduction.
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Embodiment 1
[0065] In order to verify the feasibility of the method described in the present invention; The sample number of the ferroniobium to be measured that the present embodiment adopts is 58ASD43010;
[0066] The X-ray fluorescence analysis method for the determination of multiple elements in ferroniobium is as follows:
[0067] (1) Utilize the X-ray fluorescence spectrometer to test the light intensity of the element to be measured in the standard sample and determine the best analysis conditions, then measure the drift correction sample corresponding to the standard sample and the element to be measured again, and perform curve coefficient correction to obtain the sample to be measured in ferroniobium The working curve of the element determination;
[0068] (2) Utilize the tablet method to prepare the ferroniobium sample to be measured, under the working curve of the element determination in the ferroniobium obtained in step (1), use the X-ray fluorescence spectrometer to test, a...
Embodiment 2
[0082] The ferroniobium sample to be measured that present embodiment adopts is 58A SD43010;
[0083] The difference between this embodiment and embodiment 1 is that the element to be measured in this embodiment is titanium, and the standard samples of titanium selected in step (1) are YSBS18606-08, GSB03-2202-2008, 20 / 3, 576-1, For 579-1 and prepared standard samples 2202-03, 18606-01 and 18606-02, choose YSBS18606-08 as the drift calibration sample;
[0084] Wherein, the sample preparation methods of the titanium standard sample and the drift calibration sample are exactly the same as the preparation methods of the thallium standard sample and the drift calibration sample in Example 1.
[0085] The preparation method of the ferroniobium sample to be tested in this example is exactly the same as that in Example 1.
[0086] The test result to the standard sample of titanium in step (1) is shown in the following table 3;
[0087] table 3
[0088] serial number Sa...
Embodiment 3
[0095] The ferroniobium sample to be measured that present embodiment adopts is 58A SD43010;
[0096] The difference between this embodiment and embodiment 1 is that the element to be measured in this embodiment is silicon, and the standard samples of silicon selected in step (1) are YSBS18606-08, GSB03-2202-2008, 576-1, 579-1 And prepare standard samples 2202-03, 18606-01 and 18606-02, select SQ2 as the drift calibration sample;
[0097] Wherein, the test method of the standard sample of silicon is exactly the same as the preparation method of the standard sample of titanium in Example 2, and the silicon element drift calibration sample SQ2 is the standard sample used for calibration of the instrument itself, and there is no need to make samples again. The preparation method of the iron sample is exactly the same as that in Example 2.
[0098] The test result to the standard sample of silicon in step (1) is shown in the following table 4;
[0099] Table 4
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