Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A testing method for a second-order booth coded wallace tree multiplier circuit

A test method and multiplier technology, which is applied in the test of multiplier circuit and the test field of Wallace tree multiplier circuit, can solve the problems of Wallace tree multiplier bit width, difficult traversal method test, large test vector set, etc., to achieve Reduced test time, reduced test vector set size, effect of reduced size

Active Publication Date: 2022-02-22
BEIJING MXTRONICS CORP +1
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The Wallace tree multiplier of the second-order Booth code has a large bit width, which is difficult to test by traversal
But its disadvantages are: using circular vectors, it is necessary to traverse all input situations under a certain cycle length, and the test vector set is still large, resulting in a long test time

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A testing method for a second-order booth coded wallace tree multiplier circuit
  • A testing method for a second-order booth coded wallace tree multiplier circuit
  • A testing method for a second-order booth coded wallace tree multiplier circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach

[0133] Take the complement multiplier of the Wallace tree structure of the second-order Booth code of a kind of 25 * 18 bit width as example, for this multiplier, the specific implementation mode of the present invention is as follows:

[0134] Get Multiplier Structure: Get the gate-level schematic diagram of the multiplier.

[0135] Analysis and processing multiplier structure: The multiplier contains 9 Booth coding units, among which 8 high-order Booth coding units are the same, and the input is the adjacent 3-bit multiplier B; there is another 1 low-order Booth coding unit, and the input is the lowest 2 bits Multiplier B. The multiplier includes 9 partial products, each of which contains 26 bits, corresponding to 25 bits of multiplicand A and 1 sign bit. The output of the partial product is jointly controlled by the A input and the Booth encoding unit. The above-mentioned circuit component product produces a circuit part. The multiplier includes 2:1 compressor, 3:2 compr...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention relates to a test method for a second-order Booth coded Wallace tree multiplier circuit: S1, obtaining the multiplier structure; S2, generating a test vector set for testing a partial product generation circuit; S3, generating a test vector set for a partial product compression circuit Test vector set: traverse all inputs of all compressor units in the partial product compression circuit to obtain a set of partial product array outputs; according to the topology of the multiplier, convert each partial product array output in the set of partial product array outputs into The original input of the multiplier, thereby obtains the test vector set that is used for testing partial product compression circuit; S4, compares the test vector used for partial product generation circuit and partial product compression circuit, removes repeated test vectors, obtains final test vector set input to the multiplier for test verification; S5, using a pseudo-random code test method to test the final summation circuit part. The present invention uses fewer test vectors to achieve higher test coverage.

Description

technical field [0001] The invention relates to a test method for a multiplier circuit, in particular to a test method for a Wallace tree multiplier circuit of second-order Booth coding, and belongs to the field of integrated circuits. Background technique [0002] Multipliers are widely integrated in digital signal processors and microprocessors to meet the needs of high-speed multiplication operations. In order to achieve high-speed multiplication, the design principle of the multiplier mainly adopts a method similar to manual multiplication, that is, all partial products are generated at the same time, and the partial products are compressed and finally summed to obtain the product. Based on this, the multiplier circuit mainly includes three parts: a partial product generation circuit, a partial product compression circuit, and a final summation circuit. [0003] At present, the partial product generating circuit of the mainstream multiplier mainly adopts the second-orde...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/317G01R31/3181
CPCG01R31/31707G01R31/3181
Inventor 孙健爽陈雷刘增荣李学武王文锋孙华波倪劼李琦郭琨刘亚泽赫彩甄淑琦
Owner BEIJING MXTRONICS CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products