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ADC self-test using time base and current source

An analog-to-digital converter, voltage conversion technology, applied in the direction of analog-to-digital converter, analog/digital conversion, analog/digital conversion calibration/test, etc., can solve complex cost and other problems

Pending Publication Date: 2020-04-21
MICROCHIP TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This existing technology is complex and costly due to the large number of voltage references, op amps and multiplexers that must be used

Method used

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  • ADC self-test using time base and current source
  • ADC self-test using time base and current source
  • ADC self-test using time base and current source

Examples

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Embodiment Construction

[0020] Combine below figure 1 Example aspects of the disclosure are described. figure 1 A simple, low-cost circuit is shown for ADC self-test that does not use an external voltage reference. Embodiments of the present disclosure are directed to self-testing the analog-to-digital converter against more than one voltage reference for the functional safety of circuits using the analog-to-digital converter.

[0021] In a specific example embodiment of the present disclosure, a constant current source, a stable time base, and a capacitor may be used to self-test the operation of the analog-to-digital converter by charging the capacitor for a predetermined amount of time to develop a voltage across it. This voltage will be proportional to the amount of time the capacitor is charged. Multiple points on the transfer function of the ADC can be verified during the self-test by simply varying the charging time of the capacitor. Relative accuracy between test points can be easily obt...

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Abstract

A constant current source, a stable time base and a capacitor are used to self-check operation of an analog-to-digital convertor (ADC) by charging the capacitor for a pre-determined amount of time toproduce a voltage thereon. This voltage will be proportional to the amount of time that the capacitor was charged. Multiple points on the ADC transfer function can be verified in this self-check procedure simply by varying the amount of time for charging of the capacitor. Relative accuracy among test points may then be easily obtained. Absolute accuracy may be obtained by using an accurate clock reference for the time base, a known current source and capacitor value.

Description

[0001] Related Patent Applications [0002] This application claims priority to commonly-owned U.S. Provisional Patent Application No. 62 / 580,549, filed November 2, 2017; titled "ADC Self-Test Using Time Base and Current," by James E. Bartling and Stephen Bowling , which is hereby incorporated by reference for all purposes. technical field [0003] The present disclosure relates to analog-to-digital converters (ADCs), and more particularly, to analog-to-digital converter self-tests using time bases and current sources. Background technique [0004] Functional safety of systems requires verification of the equipment used to monitor these systems. Monitoring devices are usually digital based, such as microcontrollers and microprocessors, but what is being monitored is an analog parameter. This requires analog-to-digital conversion, which is typically performed using an analog-to-digital converter (ADC). However, it is very important to perform functional testing of the ADC...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10H03M1/12
CPCH03M1/109H03M1/12H03M1/1071G01R23/00G01R31/2834H03M1/10H03M1/00H03M1/06H03M1/1009
Inventor J·E·巴特林S·鲍林
Owner MICROCHIP TECH INC