Sample stage, test method and application for suppressing quasi-cavity degenerate high-order modes
A sample stage and high-order mode technology, applied in the microwave field, can solve the problems of loss test accuracy, affecting the sample to be tested, and the inability to accurately measure the Q value, so as to achieve the effect of improving accuracy
Active Publication Date: 2022-03-08
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology
In the case of high frequency, there is a non-TEM00p mode that is very close to the frequency of the TEM00p mode, which will lead to the inability to accurately measure the Q value in the TEM00p mode, which seriously affects the loss test accuracy of the sample to be tested.
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[0040] A sample stage for suppressing degenerate high-order modes of a quasi-optical cavity, comprising a dielectric substrate 4, a circular metal coating 3 is provided in the center of the dielectric substrate 4, and a microwave matching circuit structure is engraved on the metal coating 3 1. The microwave matching circuit structure 1 is two slits parallel to the electric field direction of the TEM00q mode arranged symmetrically on both sides of the center of the circular metal coating 3, and a circular fixing hole 2 is provided on the dielectric substrate, and the fixing hole 2 is used to pass through Fasteners fix the sample stage on the quasi-optical cavity, the thickness of the metal coating 3 is greater than the skin depth of the electromagnetic wave at the working frequency point, and the loss tangent value of the material of the dielectric substrate 4 is higher than 1e-4.
[0041] In this embodiment, the dielectric substrate 4 is an FR-4 rigid dielectric substrate with ...
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Abstract
The present invention provides a sample table and its test methods and applications for curbing the optical cavity and high -mining, including the medium substrate, the center of the medium substrate is equipped with a circular metal covering layer, and the metal covering layer is engraved with microwave matching.The circuit structure, the microwave matching circuit structure is two gaps parallel to the direction of the TEM00Q mode electric field in the direction of the TEM00Q mode.The positive cut value is higher than 1E 本4, and the present invention can make the non -TEM00P mode near the TEM00P mold that does not affect the TEM00P mode, causing unsatising and impossible resonance phenomena.Drop, and then improve the double peaks that appear on the corresponding TEM00P mold to the symmetrical single peak. When using the quasi -optical cavity method to test the compound electric constant, the test of the TEM00P mold corresponds to the Q value is more real, and improve the quasi optical cavity method testing.The accuracy of the material loss is to be tested.
Description
technical field [0001] The invention belongs to the field of microwave technology, in particular to a TEM used in a quasi-optical cavity 00p The sample platform, test method and application of mode measurement complex dielectric constant. Background technique [0002] TEM 00p The quasi-optical cavity of the mode is a microwave resonator, which can be used for broadband complex permittivity measurement of dielectric materials. This technology has the characteristics of fast, broadband, accurate and reliable, and has certain practicability. Its working mode is TEM00p mode, which has the advantages of simple field structure, stability, no dispersion, wide operating frequency and so on. A common quasi-optical cavity test system consists of a reflective surface and a sample stage. There are single or two coupling holes on the reflective surface, which are used for single-port test or dual-port test respectively. By inserting a coupling ring into the coupling hole to align The ...
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IPC IPC(8): G01R27/26
CPCG01R27/2617G01R27/2641
Inventor 龙嘉威余承勇李恩涂一航李亚峰高冲高勇张云鹏郑虎
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA