Boundary scanning adapter

Abstract

The invention discloses a boundary scanning adapter which comprises a frequency divider (1), an instruction register (2), a data register (3), a TAP controller (4), a signal acquisition module (5), asignal generation module (6) and a communication interface (7), the frequency divider (1) is electrically connected with the data register (3), the TAP controller (4), the signal acquisition module (5), the signal generation module (6) and the communication interface (7). The data register (3) is in communication connection with the communication interface (7), the instruction register (2) is in communication connection with the data register (3), the data register (3) is in communication connection with the TAP controller (4), and the TAP controller (4) is in communication connection with thesignal acquisition module (5). By the adoption of the boundary scanning adapter, the functions of online testing, offline testing and the like of a circuit board with a boundary scanning device can be successfully achieved, the system size is small, and the number of connecting wires connected with the circuit board in the testing process is small.

Description

technical field [0001] The invention relates to the technical field of computers, in particular to a boundary scan adapter. Background technique [0002] With the continuous development of electronic technology, more and more large-scale programmable digital logic devices, such as FPGA, are used in electronic equipment. The use of this device improves the performance and reliability of electronic equipment, but at the same time, the complex logic relationship and fine pins also bring huge pressure to the maintenance of the equipment. Maintenance personnel cannot use probes to measure the waveforms on the pins of the chip, and it is very expensive to use a special test platform such as a "bed of needles". The birth of boundary scan technology provides a new solution to this problem. The boundary-scan protocol was proposed by the Joint Test Action Group (JTAG: Joint test action group), and in 1990 the IEEE 1149.1 industry standard was formed. This standard tests the device ...

AI Technical Summary

Problems solved by technology

The use of this device improves the performance and reliability of electronic equipment, but at the same time, the complex logic relationship and fine pins also bring huge pressure to the maintenance of the equipment

Maintenance personnel cannot use probes to measure the waveform on the pins of the chip, and the use of special test platforms such as "bed of needles" requires high costs

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