A kind of silicon dioxide film material with high insulation resistance and preparation method thereof
A technology of silicon dioxide and thin film materials, which is applied to the surface pretreatment, devices for coating liquid on the surface, coatings, etc. The effect of large-scale industrial production, simple preparation method and high insulation resistance
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Embodiment 1
[0033] A method for preparing a silicon dioxide thin film material with high insulation resistance, the preparation method is: using an atmospheric pressure discharge device at room temperature, using a metal substrate with any shape as the base material, using argon with a purity of 99.99% as the discharge gas and carrier Gas, using oxygen with a purity of 99.99% as the reaction gas, and silicon tetrachloride with a purity of 99.99% as the reaction liquid, carry out atmospheric pressure discharge to prepare a silicon dioxide film, and maintain a constant distance between the nozzle of the atmospheric pressure discharge device and the surface of the substrate, and obtain The thickness of silicon dioxide film is 1.31μm, and its insulation resistance is 1.55±0.53×10 8 Ω, calculated according to the linear relationship between the insulation resistance of the silicon dioxide film material and its thickness, the insulation resistance of the silicon dioxide film material is 1.19 ± 0...
Embodiment 2
[0036] A method for preparing a silicon dioxide thin film material with high insulation resistance, the preparation method is: using an atmospheric pressure discharge device at room temperature, using a metal substrate with any shape as the base material, using argon with a purity of 99.99% as the discharge gas and carrier Gas, using oxygen with a purity of 99.99% as the reaction gas, and silicon tetrachloride with a purity of 99.99% as the reaction liquid, carry out atmospheric pressure discharge to prepare a silicon dioxide film, and maintain a constant distance between the nozzle of the atmospheric pressure discharge device and the surface of the substrate, and obtain The thickness of silicon dioxide film is 4.86μm, and its insulation resistance is 1.25±0.14×10 9 Ω, calculated according to the linear relationship between the insulation resistance of the silicon dioxide film material and its thickness, the insulation resistance of the silicon dioxide film material is 2.57 ± 0...
Embodiment 3
[0039] A method for preparing a silicon dioxide thin film material with high insulation resistance, the preparation method is: using an atmospheric pressure discharge device at room temperature, using a metal substrate with any shape as the base material, using argon with a purity of 99.99% as the discharge gas and carrier Gas, using oxygen with a purity of 99.99% as the reaction gas, and silicon tetrachloride with a purity of 99.99% as the reaction liquid, carry out atmospheric pressure discharge to prepare a silicon dioxide film, and maintain a constant distance between the nozzle of the atmospheric pressure discharge device and the surface of the substrate, and obtain The thickness of silicon dioxide film is 5.38μm, and its insulation resistance is 2.67±0.32×10 9 Ω, calculated according to the linear relationship between the insulation resistance of the silicon dioxide film material and its thickness, the insulation resistance of the silicon dioxide film material is 4.96 ± 0...
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