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A fpga single event inversion verification circuit and method

A single-event inversion and verification circuit technology, applied in the field of FPGA, can solve the problems of increasing FPGA configuration time, decreasing FPGA configuration efficiency, and reducing FPGA configuration efficiency, so as to improve FPGA configuration efficiency, shorten FPGA configuration time, and overcome FPGA configuration. The obvious effect of the decrease in configuration efficiency

Active Publication Date: 2022-06-17
GOWIN SEMICON CORP LTD
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

Since the FPGA configuration file contains additional ECC check codes, the FPGA needs to process the extra ECC check codes in the FPGA configuration file first. The FPGA configuration file is large, which increases the FPGA configuration time and reduces the FPGA configuration efficiency; especially in the FPGA In application scenarios with large design scale and complex FPGA configuration files, the efficiency of FPGA configuration in the prior art drops significantly

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  • A fpga single event inversion verification circuit and method
  • A fpga single event inversion verification circuit and method
  • A fpga single event inversion verification circuit and method

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Embodiment Construction

[0051] In order to make those skilled in the art better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only These are some embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0052] see figure 1 , is a schematic diagram of the FPGA single-particle inversion verification circuit disclosed in the embodiment of the present invention, and the illustrated modules and components are part of the internal structure of the FPGA.

[0053] The circuit of this embodiment includes: a programming and error correction control m...

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Abstract

The invention discloses an FPGA single particle inversion verification circuit and method. In this technical solution, the FPGA is integrated with a programming and error correction control module, an error correction encoder, a check code storage module, a configuration storage module, and an error correction decoder. The programming and error correction control module reads from the outside of the FPGA FPGA configuration file, the error correction encoder generates a check code according to the FPGA configuration file, the check code storage module writes the check code, and the error correction decoder uses the check code written by the check code storage module and the configuration storage module to write The imported FPGA configuration file is used for single event inversion verification. The check code is generated inside the FPGA, and the FPGA configuration file does not contain additional check codes, so there is no need to process the extra check codes, the FPGA configuration file becomes smaller, shortens the FPGA configuration time, improves the FPGA configuration efficiency, and satisfies the requirements of the system. Real-time requirements.

Description

technical field [0001] The present invention relates to the technical field of FPGA, and in particular, to an FPGA single particle inversion verification circuit and method. Background technique [0002] Field-Programmable Gate Array (FPGA) is widely used in various fields, such as industrial control, embedded system, cryptography, aerospace, network and so on. FPGA has the characteristics of high performance and low one-time engineering cost, which is suitable for the realization of large circuits and the rapid development of new products. With the exponential growth of system performance and capacity, the noise margin of integrated circuits decreases, the power supply voltage decreases, and the possibility of low-energy particles-induced Single Event Upset (SEU) increases, making the FPGA configuration inside the FPGA. Files are susceptible to soft errors by SEU. Single event inversion is also known as single event flip. [0003] For the SEU problem, the prior art discl...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/10
CPCG06F11/10
Inventor 马鑫
Owner GOWIN SEMICON CORP LTD