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Pressure test method, system and device for HL-100 inference card

A pressure test and pressure technology, applied in the stress test field of HL-100 reasoning card, can solve time-consuming and labor-intensive problems, achieve the effect of guaranteeing product quality, improving customer satisfaction, and highlighting substantive features

Active Publication Date: 2020-05-29
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, in order to verify the compatibility of the HL-100 inference card, a variety of tests are usually required, mainly including: the data uplink and downlink transmission bandwidth test of the server memory and the memory on the HL-100 inference card, the performance test of the ResNET50 ONNX model, BERT Stability test and pressure heat dissipation test, however, the above test items are independent of each other and need to be switched manually, which is time-consuming and laborious

Method used

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  • Pressure test method, system and device for HL-100 inference card
  • Pressure test method, system and device for HL-100 inference card
  • Pressure test method, system and device for HL-100 inference card

Examples

Experimental program
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Effect test

Embodiment 1

[0041] Such as figure 1 A stress test method for the HL-100 reasoning card shown includes the following steps:

[0042] S1: Check that the HL-100 reasoning card can be recognized normally under the current system. Specifically include: count the number of HL-100 inference cards recognized in the current system, and save it to HL-100_num.txt; check the working mode of the PCIe interface of the HL-100 inference card, and save it to the PCIeSpeed.txt file.

[0043] S2: Obtain the bus IDs of all HL-100 reasoning cards in the system through the command #lspci-d 1da3; use the for loop to traverse the bus IDs of all HL-100 reasoning cards, and continuously perform pressure cooling on the HL-100 reasoning cards one by one Test, 1-hour BERT stability test and 1-hour server memory and card memory data uplink and downlink transmission bandwidth test, and save the test results, display pass or fail.

[0044] S3: Conduct a 24-hour pressure and heat dissipation test on all HL-100 inferenc...

Embodiment 2

[0047] Such as figure 2 A stress test method for the HL-100 reasoning card is shown. The specific implementation steps and corresponding script content are as follows:

[0048] 1. Check that the HL-100 reasoning card can be recognized normally under the system:

[0049]#lspci–d lda3:|wc–l|tee–a HL-100_num.txt

[0050] Count the number of boards recognized in the system and save them in HL-100_num.txt;

[0051] #hl-smi–L|grep–E“Bus Id|Link Speed|Link Width|Max|Current”|tee–aPCIeSpeed.txt

[0052] Check the working mode of the PCIe interface on the board and save it to the PCIeSpeed.txt file.

[0053] 2. Use the command #lspci-d 1da3: Obtain the bus IDs of all HL-100 inference cards in the system, use the for loop to traverse the bus IDs of all inference cards, and continuously perform 1h pressure heat dissipation test and 1h BERT stability test on the boards one by one Interact with the data uplink and downlink transmission bandwidth tests of the server memory and the memo...

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Abstract

The invention provides a pressure test method, system and device for an HL-100 inference card. The multi-dimensional interactive stability test can be performed on the HL-100 inference card; data uplink and downlink transmission bandwidth testing, ResNET50ONNX model performance testing, BERT stability testing and pressure heat dissipation testing of a server memory and a memory on an HL-100 inference card are provided respectively, and interaction between different tests is carried out. According to the invention, the HL-100 inference cards are tested from different angles and are mutually switched, so that the compatibility of the HL-100 inference cards on a server product is fully and effectively verified.

Description

technical field [0001] The present invention relates to the technical field of computer testing, and more specifically relates to a pressure testing method, system and equipment for an HL-100 reasoning card. Background technique [0002] The HL-100 Inference Card is a Deep Neural Network (DNN) PCIe card for high-volume inference workloads. The HL-100 is a dual-slot 10-inch PCI express Gen4 card with an HL-1000 processor, which can achieve a throughput of 15,000 images per second based on the ResNet-50 inference benchmark, with a latency of 1.3 milliseconds and power consumption At just 100 watts, it is one to three orders of magnitude more powerful than typical solutions deployed in data centers today. HL-100 has built-in 4GB / 8GB / 16GB online DDR4 memory, 8MB on-board serial flash memory, and the memory has ECC protection (single error correction / double error detection). The TDP total board power is 200W. [0003] At present, in order to verify the compatibility of the HL-...

Claims

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Application Information

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IPC IPC(8): G06F11/34
CPCG06F11/3466
Inventor 彭笑笑
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD