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A stress testing method, system and equipment for hl-100 reasoning card

A stress test and stress technology, applied in the field of stress testing of HL-100 reasoning card, can solve problems such as time-consuming and labor-intensive, and achieve the effect of ensuring product quality, improving customer satisfaction, and highlighting substantive features

Active Publication Date: 2022-08-05
INSPUR SUZHOU INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, in order to verify the compatibility of the HL-100 inference card, a variety of tests are usually required, mainly including: the data uplink and downlink transmission bandwidth test of the server memory and the memory on the HL-100 inference card, the performance test of the ResNET50 ONNX model, BERT Stability test and pressure heat dissipation test, however, the above test items are independent of each other and need to be switched manually, which is time-consuming and laborious

Method used

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  • A stress testing method, system and equipment for hl-100 reasoning card
  • A stress testing method, system and equipment for hl-100 reasoning card
  • A stress testing method, system and equipment for hl-100 reasoning card

Examples

Experimental program
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Effect test

Embodiment 1

[0041] like figure 1 A stress test method for the HL-100 reasoning card shown, including the following steps:

[0042] S1: Check that the HL-100 reasoning card can be recognized normally under the current system. Specifically, it includes: counting the number of HL-100 inference cards identified in the current system and saving it to HL-100_num.txt; checking the working mode of the PCIe interface of the HL-100 inference card and saving it to the PCIeSpeed.txt file.

[0043] S2: Use the command #lspci-d 1da3: to obtain the bus IDs of all HL-100 inference cards under the system; use a for loop to traverse the bus IDs of all HL-100 inference cards, and perform pressure cooling on the HL-100 inference cards one by one for 1 hour. Test, 1 hour BERT stability test and 1 hour data upstream and downstream transmission bandwidth test of server memory and memory on the card, and save the test results, showing pass or fail.

[0044] S3: Perform a 24-hour stress cooling test on all HL-1...

Embodiment 2

[0047] like figure 2 The stress test method of a HL-100 inference card shown, the specific implementation steps and the corresponding script content are as follows:

[0048] 1. Check that the HL-100 reasoning card can be recognized normally under the system:

[0049]#lspci–d lda3:|wc–l|tee–a HL-100_num.txt

[0050] Count the number of boards identified under the system and save them to HL-100_num.txt;

[0051] #hl-smi–L|grep–E “Bus Id|Link Speed|Link Width|Max|Current”|tee–aPCIeSpeed.txt

[0052] View the working mode of the PCIe interface of the board and save it to the PCIeSpeed.txt file.

[0053] 2. Use the command #lspci-d 1da3: to obtain the bus IDs of all HL-100 inference cards under the system, use a for loop to traverse the bus IDs of all inference cards, and continuously perform 1h pressure heat dissipation test and 1h BERT stability test on the boards one by one Interact with the data upstream and downstream transmission bandwidth test of the server memory and t...

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Abstract

The stress testing method, system and device for an HL-100 inference card proposed by the present invention can perform multi-dimensional interactive stability tests on the HL-100 inference card, and respectively provide a method for testing the server memory and the HL-100 inference card. Data upstream and downstream transmission bandwidth test of memory, performance test of ResNET50ONNX model, BERT stability test and stress heat dissipation test methods, and the interaction between different tests. The invention tests the HL-100 reasoning card from different angles and switches each other, and fully and effectively verifies the compatibility of the HL-100 reasoning card on the server product.

Description

technical field [0001] The invention relates to the technical field of computer testing, and more particularly to a stress testing method, system and device for an HL-100 reasoning card. Background technique [0002] The HL-100 Inference Card is a Deep Neural Network (DNN) PCIe card for high-volume inference workloads. The HL-100 is a dual-slot 10-inch PCI express Gen4 card with one HL-1000 processor that achieves a throughput of 15,000 images per second based on the ResNet-50 inference benchmark with 1.3ms latency and power consumption At just 100 watts, the phase performance is one to three orders of magnitude higher than typical solutions deployed in data centers today. HL-100 has built-in 4GB / 8GB / 16GB online DDR4 memory, 8MB on-board serial flash memory, and the memory has ECC protection (single error correction / double error detection). The total board power of TDP is 200W. [0003] Currently, in order to verify the compatibility of the HL-100 inference card, various ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/34
CPCG06F11/3466
Inventor 彭笑笑
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD