Test case design method for discovering memory leak bug

A technology for test cases and memory leaks, applied in software testing/debugging, computing, error detection/correction, etc., can solve problems such as memory leaks, one-time memory leaks, implicit memory leaks, etc., to reduce negative effects and ensure comprehensive performance and accuracy, transaction stock data and incremental data are accurate and real-time

Pending Publication Date: 2020-05-29
HANGZHOU ANHENG INFORMATION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The code with a memory leak will be executed multiple times, and each time it is executed, it will cause a memory leak
[0006] 2. Occasional memory leaks
[0007] 3. One-time memory leak
[0008] 4. Implicit memory leaks
But for a server program that needs to run for days, weeks or even months, not releasing the memory in time may eventually exhaust all the memory of the system

Method used

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  • Test case design method for discovering memory leak bug

Examples

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Effect test

Embodiment 1

[0030] Embodiment 1, find the test case design method of memory leak bug, as figure 1 shown;

[0031] 1. The usage scenarios of the present invention are:

[0032] The present invention is suitable for the business system of the cluster structure, and the transaction data volume of the tested system is large, and the number of concurrency is high;

[0033] Two, the system architecture description of the present invention:

[0034] The tested system is a clustered system, and the system services are installed on multiple hosts, and through the load balancing component, transactions are sent to different hosts through certain rules. The database recording method of the system application is a traditional relational database + redis cache;

test Embodiment 8

[0035] Eight elements of a test case: serial number, use case title, preset conditions, priority, test input, operation steps, expected results, and actual results.

[0036] The priority is based on the specific test situation. If the company pays attention to the problem of memory leaks and has specific standards during the test, the priority can be rated as medium or high, and the serial number can be incremented.

[0037] 3. Test case design:

[0038] 3.1. Test tool: jmeter / loadrunner. Use stress testing tools to cover all business interfaces of the system under test, simulating real concurrency as much as possible.

[0039] For example, from the design of business functions to subsequent transactions, the combination and execution sequence of the original transaction and subsequent transactions should be close to the real business scenario.

[0040] 3.2. For the scene of finding the bug of memory leak, the present invention can use boundary value method and scene method:...

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PUM

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Abstract

The invention provides a test case design method for discovering memory leak bug. The method comprises the following steps: 1) covering all service interfaces of a tested system by using a pressure test tool; 2) simulating a scene; and 3) executing a pressure test. The invention aims to solve the problem of how to discover the memory leak bug of a tested system as much as possible through the design and permutation and combination of test cases in a cluster architecture system. Nowadays, a high-availability scheme is universally applied to various internet systems, the negative influence of afusing mechanism on the system can be reduced to the greatest extent, and the comprehensiveness and accuracy of system data are guaranteed. After the system is recovered, the transaction in the abnormal period of the system can be captured, and the transaction stock data and incremental data are ensured to be accurate and real-time.

Description

technical field [0001] The invention relates to a test case design method for bugs, in particular to a test case design method for finding memory leak bugs. Background technique [0002] Memory leak (Memory Leak) refers to the heap memory that has been dynamically allocated in the program is not released or cannot be released for some reason, resulting in a waste of system memory, resulting in serious consequences such as slowing down the running speed of the program and even system crashes. [0003] Program bugs caused by memory leaks are not only the focus of performance testing, but also the problem to be found in system testing. During the system test phase, it is easier to find obvious memory leaks. During the stress test, he can clearly find a significant increase in system memory. However, for the tested system, there is an implicit memory leak problem, which is difficult to find, and it cannot be detected by conventional stress tests. [0004] Memory leak problems ...

Claims

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/3684
Inventor 苏立莹范渊
Owner HANGZHOU ANHENG INFORMATION TECH CO LTD
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