Method for calculating dislocation density of deformed crystal material based on single diffraction peak

Abstract

The invention discloses a method for calculating dislocation density of a deformed crystal material based on a single diffraction peak. The method comprises the following steps of: utilizing a synchrotron radiation energy scanning X-ray diffraction technology to obtain an experimental intensity distribution curve of diffraction intensity of the deformed crystal material relative to a diffraction vector mode and a reference intensity distribution curve of diffraction intensity of a non-deformed crystal material relative to the diffraction vector mode; introducing a dimensionless variable M, andcalculating a standard intensity distribution curve of a diffraction peak after dislocation density normalization; calculating a specific M value of the experiment intensity distribution curve according to the experiment intensity distribution curve and the standard intensity distribution curve, and recording the specific M value as M'; and calculating the dislocation density of the deformed crystal material according to the full widths at half maximum of the experimental intensity distribution curve, the standard intensity distribution curve and the reference intensity distribution curve. The dislocation density of the deformed crystal material can be obtained by analyzing the intensity distribution curve of the single diffraction peak, and the experiment time is shortened.

Description

technical field [0001] The disclosure belongs to X-ray diffraction peak analysis technology, in particular to a method for calculating the dislocation density of a deformed crystal material based on a single diffraction peak. Background technique [0002] As an efficient characterization method, synchrotron radiation X-ray diffraction is widely used to study the microstructure of various crystal materials. The traditional method of measuring the local strain and defect density of materials is synchrotron radiation monochromatic X-ray diffraction. During the measurement, the sample needs to be continuously tilted in two dimensions with small steps. high. As a new technology, synchrotron radiation energy scanning X-ray diffraction continuously changes the energy of incident X-rays during the measurement. The experimental process does not require tilting the sample, so the requirements for the experimental device and sample preparation are simpler. By analyzing the energy sca...

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Problems solved by technology

In view of the fact that the experimental machine of the synchrotron radiation source is very tight, it is a time-consuming solution to collect the signals of many diffraction peaks through energy scanning, especially when it is necessary to study the dislocation density at different positions of the deformed crystal material, the disadvantages are more prominent

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