Ionic migration spectrometry-flight time mass spectrometer

Abstract

The invention relates to a mass spectrometry instrument, in particular to an ionic migration spectrometry-flight time mass spectrometer, and the mass spectrometer comprises an ionic migration spectrometry cavity, a mass spectrometry transmission area cavity, a mass analyzer cavity and a data acquisition card; an ionization source, an ion gate and an ion migration region electrode are sequentiallyarranged in the ionic migration spectrometry cavity from top to bottom; a repulsion polar plate, a flight time mass analyzer and a micro-channel plate detector are arranged in the mass analyzer cavity; pulse voltages Ugate, Upulse and Ucard are respectively applied to acquisition trigger terminals of the ion gate, the repulsion polar plate and the acquisition card; and the pulse voltage Upse and the pulse voltage Ucard are synchronized based on the rising edge or falling edge moment of the pulse signal of the pulse voltage Ugate. The ionic migration spectrometry-flight time mass spectrometer can effectively improve the utilization efficiency of ions, the two-dimensional analysis speed of ionic migration spectrometry-mass spectrometry and the detection sensitivity by synchronizing and modulating the pulse time sequences of the ion gate, the repulsion polar plate and the acquisition card.

Description

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AI Technical Summary

Benefits of technology

This patented device improves upon existing methods for analyzing both polarized gases (I) or charged particles (II). By combining different techniques together it can achieve better results than just simply measuring one type of particle alone.

Problems solved by technology

This patented technical problem addressed in this patents relates to improving the performance and accuracy of analyzing both positive and negative charges within specific atomic species called metals or compounds due to its unique properties like size, shape, charge density, and velocity dispersion characteristics. Current methods require expensive equipment and take several hours to analyze each component separately, making accurate identification challenged even more quickly than current techniques.

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