Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Double-station FPC supplementary material deviation and re-pasting/missing-pasting inspection machine

A dual-station, inspection machine technology, applied in the analysis of materials, optical testing of flaws/defects, and material analysis by optical means, can solve problems such as false detection, eliminate measurement errors, improve inspection accuracy, and shorten the inspection process. Effect

Active Publication Date: 2020-06-05
ZHUHAI RUIXIANG ELECTRONICS
View PDF14 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The reinforcement height measured by this detection method will also be affected by the tilting of the table and the product, and there are defects that are prone to false detection

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Double-station FPC supplementary material deviation and re-pasting/missing-pasting inspection machine
  • Double-station FPC supplementary material deviation and re-pasting/missing-pasting inspection machine
  • Double-station FPC supplementary material deviation and re-pasting/missing-pasting inspection machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] see figure 1 , the dual-station FPC supplementary material offset of the preferred embodiment of the present invention, re-posting / missing pasting inspection machine includes a cabinet 10 and a control system with a display and a touch screen 100, and the cabinet 10 corresponds to the loading platform 71 and the blanking Platform 72 (see figure 2 ) are respectively provided with openable and closable front doors 11, and the bottom of the front door 11 is provided with openable and closable maintenance cabinet doors 12. The front door 11 has a hinged side hinged with the cabinet 10 , and nitrogen springs are arranged between the cabinet 10 and both sides of the front door 11 adjacent to the hinged side, so that the front door 11 can be opened and closed.

[0030] figure 2 and 3 The internal structure of a preferred embodiment of the inspection machine is shown. see figure 2 , there is an installation carrier 20 arranged horizontally in the cabinet 10, and the ins...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a double-station FPC supplementary material deviation and re-pasting / missing-pasting inspection machine which comprises a feeding platform, a feeding manipulator, a dischargingplatform and a discharging manipulator. The inspection machine is provided with two inspection stations which are arranged front and back side by side, and each inspection station is provided with aclamping conveying device capable of moving left and right; an upper cross beam is arranged above the clamping conveying devices, and an upper inspection camera and an upper contact type displacementsensor which can move front and back are arranged on the left side and the right side of the upper cross beam respectively; a lower cross beam is arranged below the clamping conveying devices, and a lower inspection camera and a lower contact type displacement sensor which can move front and back are arranged on the left side and the right side of the lower cross beam respectively; the upper contact type displacement sensor and the lower contact type displacement sensor are oppositely arranged in the height direction, and the upper contact type displacement sensor and the lower contact type displacement sensor can do lifting motion. The inspection machine has the functions of deviationand re-pasting / missing pasting detection, and is simple and compact in structure and high in inspection precision and efficiency.

Description

technical field [0001] The invention relates to a device for inspecting lamination defects of FPC supplementary materials; more specifically, it relates to an inspection machine for inspecting defects of FPC supplementary materials for deviation, re-adhesion / missing-adhesion. Background technique [0002] FPC (flexible / soft / flexible circuit board or circuit board) has many advantages such as saving space, reducing weight, high flexibility and flexibility, but it also has the disadvantage of low mechanical strength. Therefore, a supplementary material (reinforcing sheet) is usually attached to a predetermined area on the surface of the FPC to improve the mechanical strength of the predetermined area, thereby facilitating the installation of electronic components and the overall assembly of the product. When attaching supplementary materials, there may be defects such as position deviation of supplementary materials, repositioning of supplementary materials (that is, repeated ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G01N21/95G01N21/01
CPCG01N21/01G01N21/88G01N21/95
Inventor 贺庆方慰任冯立志魏庆
Owner ZHUHAI RUIXIANG ELECTRONICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products