Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Pantograph structure abnormity detection algorithm based on image processing

An anomaly detection and image processing technology, applied in image data processing, image enhancement, image analysis, etc., can solve the problems of slow processing progress, inaccurate calculation complexity, and inability to judge the abnormality of the pantograph structure, and achieve good online detection needs, good application prospects, and the effect of meeting the needs of online testing

Pending Publication Date: 2020-06-09
成都地铁运营有限公司
View PDF6 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, in these image recognition technical solutions of the prior art, for the positioning of the pantograph in the image and the method of extracting the features of the pantograph, in actual use, there will be problems of inaccuracy and high computational complexity, resulting in slow processing progress , and this type of algorithm can only conduct qualitative analysis on whether the pantograph is abnormal, and cannot determine the degree of structural abnormality of the pantograph

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Pantograph structure abnormity detection algorithm based on image processing
  • Pantograph structure abnormity detection algorithm based on image processing
  • Pantograph structure abnormity detection algorithm based on image processing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0042] This embodiment discloses a pantograph structural abnormality detection algorithm based on image processing, such as figure 1 , comprising an image preprocessing step, a pantograph positioning step, a pantograph contour extraction step, a key contour extraction step, a key point extraction step, and a parameter calculation and abnormal judgment step;

[0043] The image preprocessing step is to remove the noise in the image to be recognized; the pantograph image is taken 24 hours a day and at night, so there will be uneven illumination and low image contrast. In addition, the electronic interference of the camera itself adopts JPEG format For some reasons, such as compressing the original image of the pantograph, it is easy to cause noise in the captured image. If the original image captured by the camera is not preprocessed, the accuracy of subsequent feature extraction will be affected, thereby affecting the accuracy of pantograph positioning and abnormal judgment.

...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of pantograph structure anomaly detection, discloses a pantograph structure abnormity detection algorithm based on image processing. The method comprises an image preprocessing step, a pantograph positioning step, a pantograph contour extraction step, a key contour extraction step, a key point extraction step and a parameter calculation and abnormity judgment step. Positioning a pantograph image contained in the to-be-identified image subjected to the image preprocessing step by adopting an HOG + SVM method; the pantograph structure abnormity detection algorithm provided by the invention has good adaptability to images with complex backgrounds, uneven illumination, noise and the like, is high in algorithm detection accuracy, and improves the detection efficiency of pantograph structure abnormity faults.

Description

technical field [0001] The technical field of pantograph structural anomaly detection of the present invention, in particular relates to an image processing-based pantograph structural anomaly detection algorithm. Background technique [0002] With the rapid development of the railway industry, the requirements for its transportation safety are getting higher and higher. The pantograph is one of the main components that provide energy to the electric locomotive. If there is a fault defect in the structure, it may cause serious traffic accidents and endanger the driving safety. Therefore, accurate and timely detection of abnormal pantograph structural faults is of great significance for pantograph maintenance and driving safety. [0003] When the train is running, it needs to take power from the catenary through the pantograph on the roof. With the rapid development of domestic rail transit, the locomotive pantograph-catenary system is widely used in it. class defect failu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T7/00G06K9/00G06K9/32G06K9/46G06K9/62
CPCG06T7/0004G06T2207/10004G06T2207/20081G06T2207/20192G06T2207/20104G06T2207/30108G06V20/10G06V10/25G06V10/462G06F18/214G06F18/2411
Inventor 徐安雄陈辉万壮陈诚胡传段豪翔卢强赵坤张琳山
Owner 成都地铁运营有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com