Defect layering detection device and method

Abstract

The invention provides a defect layering detection device and method. The method comprises the following steps: shooting upper and lower defect images of a detected object under a short-wave ultraviolet light source by adopting a camera assembly, respectively comparing the upper and lower defect images with defect images of the detected object shot by the camera assembly under a natural light source, and judging the depth position of the defect of the detected object. Defects on the surface of the liquid crystal display panel and defects in the liquid crystal display panel can be automaticallydistinguished, dust on the surface layer is filtered, and the detection efficiency is improved.

Description

technical field [0001] The present invention relates to the technical field of liquid crystal panel defect detection equipment, in particular to a defect layer detection device and method. Background technique [0002] With the development of the country's economy, the demand for LCD panels from industry and the public is increasing, and the requirements for high-quality LCD panels are also increasing. Defects in the LCD panel will reduce the performance of the LCD panel, resulting in a large number of Scrap and rejects. Therefore, a set of practical LCD panel quality inspection equipment is very necessary. [0003] Automatic optical inspection is a measurement method widely used in the liquid crystal industry, and automatic optical inspection equipment is the most widely used testing equipment in the liquid crystal industry. Liquid crystal panels are generally composed of cover glass and multi-layer films. During the processing, defects caused by foreign matter mixed into...

AI Technical Summary

Problems solved by technology

However, existing automatic optical inspection equipment is usually unable to effectively distinguish whether the defect is located inside or outside the LCD panel.

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