Signal overshoot analysis method and device
An analysis method and analysis device technology, applied in the direction of measuring devices, instruments, measuring electrical variables, etc., can solve the problems of lack of system analysis methods, chip function impact, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0047] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0048] In the embodiment of the present invention, the execution subject of the process is the terminal device of the signal overshoot analysis method, and the terminal device includes a server, a computer device, a tablet computer, a smart phone, a router, a switch and other terminal devices with local storage capabilities. The storage module saves the obtained signal overshoot data, so that the administrator can obtain it offline. figure 1 It shows the implementation flow chart of the signal overshoot analysis method provided by the first embodiment of the present invention, which is described in...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com