Detection circuit and detection method

Abstract

The embodiment of the invention provides a detection circuit and a detection method. The detection circuit comprises a detected module and a detection module; the detected module is provided with an overturning state output end and a data output end; the detected module is connected with the detection module through the overturning state output end, and the detected module is further connected with a preset data processing device through the data output end; and the tested module is used for generating particle overturning state data and operation result data. According to the embodiment of the invention, whether the tested module has a storage error or not can be judged according to the matching condition of the particle overturning state data and the preset overturning reference data; and whether the tested module has a sampling error or not is judged according to the matching condition of the operation result data and preset logic reference data on the basis of judging whether the tested module has a storage error or not. Therefore, whether the data stored in the tested module have errors or not and the error type of the data are detected, and then the stability of the tested module under particle beam radiation is determined.

Description

technical field [0001] The invention relates to the field of electronic technology, in particular to a detection circuit and a detection method. Background technique [0002] The Single-Event Upsets effect refers to the jump of the potential state caused by a large number of high-energy charged particles in a digital circuit chip in a radiation environment, and "0" becomes "1", or "1" becomes "0". Phenomenon. In order to ensure the normal operation of aerospace equipment in orbit, use the ground high-energy proton or heavy ion radiation simulation equipment to conduct radiation tests on electronic components (including anti-single event flipping, single-event locking, and single-event burning capabilities), and as much as possible to test the internal components of the device. The single event flips the sensitive module for positioning, providing support for the subsequent radiation-resistant hardening design of the device. [0003] An existing irradiation test scheme is t...

AI Technical Summary

Problems solved by technology

However, this solution can only test the test results of the functions represented by the status register, and cannot locate the errors of specific devices, and the status register itself may be affected by radiation, making the test results inaccurate

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