A detection circuit and detection method

Abstract

Embodiments of the present invention provide a detection circuit and a detection method. The detection circuit includes: a tested module and a detection module; the tested module has an inversion state output end and a data output end, and the tested module is connected to the detection module through the inversion state output end , the detected module is also connected with the preset data processing device through the data output terminal; the detected module is used to generate particle inversion state data and operation result data. In the embodiment of the present invention, it is possible to judge whether a storage error occurs in the tested module according to the matching situation between the particle flip state data and the preset flip reference data; Logical reference data matching to determine whether the module under test has a sampling error. In this way, it is possible to detect whether the data stored by the tested module has an error, and the error type of the data, so as to determine the stability of the tested module when it is irradiated by the particle beam.

Description

technical field [0001] The invention relates to the field of electronic technology, in particular to a detection circuit and a detection method. Background technique [0002] The Single-Event Upsets effect refers to the transition of the potential state caused by a large number of high-energy charged particles in the radiation environment of the digital circuit chip, "0" becomes "1", or "1" becomes "0" Phenomenon. In order to ensure the normal operation of aerospace equipment in orbit, use ground high-energy proton or heavy ion radiation simulation equipment to conduct irradiation tests on electronic components (including anti-single-event overturning, single-event locking, and single-event burning capabilities), and as far as possible inside the device. The single-event flip-sensitive module is positioned to provide support for the subsequent radiation hardening design of the device. [0003] An existing irradiation test scheme is to scan the input data into the scan chai...

AI Technical Summary

Problems solved by technology

However, this solution can only test the test results of the functions represented by the status register, and cannot locate the errors of specific devices, and the status register itself may be affected by radiation, making the test results inaccurate

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