Structured light-based two-dimensional DIC optical extensometer out-of-plane compensation device and method
A technology of optical extensometer and compensation device, applied in the direction of using optical device, measurement device, calculation, etc., can solve the problem of low measurement accuracy, and achieve the effect of improving measurement accuracy
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[0045] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0046] As mentioned in the background technology, the basic principle of the 2D-DIC method is to use a fixed camera to capture digital images of the plane specimen before and after deformation, and by matching the images before and after deformation, the pixel deformation information of the measurement surface of the specimen can be obtained. Therefore, the 2D-DIC method can only measure the in-plane displacement of planar specimens. When the measurement surfa...
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