An optimized flash memory solid state disk heating method and flash memory solid state disk
A heating method and solid-state disk technology, applied in the input/output process of data processing, instruments, input/output to record carriers, etc., can solve the problems of increasing energy consumption, time-consuming heating operation, and inability to implement flash memory solid-state disks, etc. , to achieve the effect of reducing high latency, improving efficiency, and solving data distribution problems
Active Publication Date: 2021-07-02
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology
[0004] Since the heating operation is time-consuming, for example, close to one second, every time the heating is performed, it will negatively affect the normal execution of I / O read and write operations, causing fluctuations in the performance of the flash SSD
In addition, performing heating operations in these chip structures requires a sustained period of electrical and energy consumption
Especially when a large number of heating operations are performed within a certain period of time, it will cause great performance fluctuations and increase energy consumption, thus making it impossible to achieve a stable flash SSD
Method used
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[0034] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.
[0035] At first, the terms involved in the present invention are explained as follows:
[0036] Flash block residence time: The time between two consecutive erase and write times of a flash block.
[0037] Such as figure 1 As shown, the invention provides a kind of optimized flash memory solid-state disk heating method, and this method comprises the following steps:
[0038] Step S1. Record t...
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The invention discloses an optimized flash memory solid state disk heating method and the flash memory solid state disk, which belong to the field of flash memory storage devices. Including: record the average residence time DT of each flash block in the flash solid state disk at the end of its life avg , according to the average residence time of flash memory blocks, calculate the actual reliability RBER of flash memory blocks; compare the size of RBER and CBER of each flash memory block, according to DT avg The order of the value is added to the appropriate position in the corresponding list; when the flash solid-state disk reaches the end of its service life, only the flash memory blocks in the list of flash memory blocks with short residence time will be heated, and the flash memory blocks with long residence time The flash memory block does not perform heating operation. By considering the influence of the average residence time of the flash memory block on the reliability recovery of the flash memory, the present invention can reduce a part of unnecessary high-delay and high-energy heating operations without affecting the reliability of the solid-state hard disk, and improve the reliability of the solid-state disk. Hard disk heating efficiency.
Description
technical field [0001] The invention belongs to the field of flash memory storage devices, and more specifically relates to an optimized method for heating a flash memory solid state disk and a flash memory solid state disk. Background technique [0002] A flash solid-state disk is a non-volatile storage device that uses flash memory as a storage medium, and is widely used in computer storage systems. Flash SSDs have many different inherent characteristics compared to mechanical hard drives. For example, the reading and writing speed is asymmetrical, the data is updated in different places, and the flash memory chip has a fixed number of times of erasing and writing (P / E), etc. When the erasing and writing times of the flash chip in the flash solid state drive reach the preset threshold value given by the manufacturer, the flash solid state drive will not be able to guarantee the validity of the stored data information, thus reaching the lifespan of the flash solid state dr...
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IPC IPC(8): G06F3/06
CPCG06F3/0614G06F3/064G06F3/0679
Inventor 崔金华刘伟光刘俊伟杨天若
Owner HUAZHONG UNIV OF SCI & TECH