A method for correcting the low-level cut height of infrared occultation sensors based on non-absorbing spectroscopy

A star sensor and non-absorbing technology, which is applied in the field of low-level cutting height of infrared occultation sensors based on non-absorbing spectrum correction, can solve the problem of inaccurate first-level cutting height, and achieve the effect of saving CPU time and simple operation

Active Publication Date: 2022-06-03
NANTONG UNIVERSITY +1
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a simpler, faster and more accurate method based on the high-resolution infrared detection instrument of Gaofen No. Method of Absorption Spectrum Correction for Low Layer Cut Height of Infrared Occultation Sensor

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method for correcting the low-level cut height of infrared occultation sensors based on non-absorbing spectroscopy
  • A method for correcting the low-level cut height of infrared occultation sensors based on non-absorbing spectroscopy
  • A method for correcting the low-level cut height of infrared occultation sensors based on non-absorbing spectroscopy

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a method for correcting the low-level cut height of an infrared occultation sensor based on a non-absorbing spectrum. The detection spectral data above the height; Step 2: Analyze the detection spectral data to determine the low-level cut height range to be corrected; Step 3: Through the HITRAN spectral absorption library, analyze the effective observation spectrum of GF-AIUS (750-4100cm ‑1 ) within the position of the completely non-absorbing band; step 4: high-pass filter the spectrum of the full effective band, extract the spectral data of the non-absorbing band within the corresponding cut height range, and calculate the scaling factor; step 5: according to the scaling factor, Correct the spectrum on the lower cut height; Step 6: Carry out atmospheric correction on the lower cut height. The beneficial effects of the present invention are: the rapid height-cut correction method of the present invention is simpler, faster and more accurate.

Description

A method for correcting the low-level cut height of infrared occultation sensors based on non-absorbing spectroscopy technical field The present invention relates to infrared occultation sensor detection cut height correction technical field, particularly relate to a kind of based on non-absorbing light A method for spectrally correcting the low-level cut height of an infrared occultation sensor. Background technique [0002] High accuracy plays a crucial role in satellite occultation observation modes. Tangent Height) refers to the vertical distance from the tangent point between the observation point and the atmosphere to the earth's surface. Retrieving the composition of gases in the atmosphere In the process, the height of the cut height affects the accuracy of the atmospheric composition inversion. Very high resolution infrared for atmospheric environment of Gaofen-5 The detector (GF5‑AIUS) makes observations when it detects the sun. At sunrise, due to atmosph...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/3504
CPCG01N21/3504
Inventor 王红梅张玉贵鲁之君
Owner NANTONG UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products