The invention provides a method for correcting low-layer tangent height of an infrared obscuration sensor based on non-absorption spectroscopy, which comprises the following steps: step 1, detecting first-level spectral data through GF-AIUS, the first-level spectral data comprising a plurality of first-level tangent heights and detection spectral data at a plurality of tangent heights; 2, analyzing the detection spectral data, and determining a low-layer tangent height range to be corrected; 3, through an HITRAN spectral absorption library, analyzing the position of a wave band which is not absorbed completely in a GF-AIUS effective observation spectrum section (750-4100 cm <-1>); 4, performing high-pass filtering on the spectrum of the full effective waveband, extracting spectral data ofa non-absorption waveband in a corresponding tangent height range, and calculating a scaling factor; 5, correcting the spectrum on the low-layer tangent height according to the scaling factor; and 6,conducting atmospheric correction on the low-layer cut height. The beneficial effects are that the rapid height cutting correction method is simpler, more convenient, quicker and more accurate.