Method for correcting low-layer tangent height of infrared obscuration sensor based on non-absorption spectrum

A star sensor and non-absorbing technology, which is applied in the field of low-level cutting height of infrared occultation sensors based on non-absorbing spectrum correction, can solve the problem of inaccurate first-level cutting height, and achieve the effect of saving CPU time and simple operation

Active Publication Date: 2020-08-07
NANTONG UNIVERSITY +1
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a simpler, faster and more accurate method based on the high-resolution infra

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for correcting low-layer tangent height of infrared obscuration sensor based on non-absorption spectrum
  • Method for correcting low-layer tangent height of infrared obscuration sensor based on non-absorption spectrum
  • Method for correcting low-layer tangent height of infrared obscuration sensor based on non-absorption spectrum

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0050] see Figure 1 to Figure 5 As shown, the technical solution provided by the present invention is a method for correcting the low-level cut height of an infrared occultation sensor based on a non-absorbing spectrum, comprising the following steps:

[0051] Step S101: By obtaining the initial primary data, the primary data includes multiple primary cut heights and spectral data on multiple cut heights, analyze the spectra on the two detection bands MCT and InSb respectively, and draw the From 15 observed cut heights (effectively observing the first cut height) to 25 cut heights, it can be obtained through analysis, at 830cm -1 to 850cm -1 In the range, there is no obvious absorption, but the observation spectrum at the 15th-18th cut height is obviously low;

[0052] Step S102: Select 830cm -1 -850cm -1 Range, perform high-pass filtering on the upper-level spectral data and solar spectrum from the 15th to the 18th observed cut-height to remove noise caused by instrument...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a method for correcting low-layer tangent height of an infrared obscuration sensor based on non-absorption spectroscopy, which comprises the following steps: step 1, detecting first-level spectral data through GF-AIUS, the first-level spectral data comprising a plurality of first-level tangent heights and detection spectral data at a plurality of tangent heights; 2, analyzing the detection spectral data, and determining a low-layer tangent height range to be corrected; 3, through an HITRAN spectral absorption library, analyzing the position of a wave band which is not absorbed completely in a GF-AIUS effective observation spectrum section (750-4100 cm <-1>); 4, performing high-pass filtering on the spectrum of the full effective waveband, extracting spectral data ofa non-absorption waveband in a corresponding tangent height range, and calculating a scaling factor; 5, correcting the spectrum on the low-layer tangent height according to the scaling factor; and 6,conducting atmospheric correction on the low-layer cut height. The beneficial effects are that the rapid height cutting correction method is simpler, more convenient, quicker and more accurate.

Description

technical field [0001] The invention relates to the technical field of infrared occultation sensor detection cut height correction technology, in particular to a method for correcting low-level cut height of an infrared occultation sensor based on a non-absorption spectrum. Background technique [0002] The accuracy of cut height plays a crucial role in satellite occultation observation mode. Tangent Height refers to the vertical distance from the tangent point between the observation point and the atmosphere to the earth's surface. In the process of inversion of gas composition in the atmosphere, the height of the cut height affects the accuracy of the inversion of atmospheric composition. The Gaofen-5 Atmospheric Environment Infrared Very High Resolution Sounder (GF5-AIUS) will make observations when it detects the sun. At sunrise, due to the refraction of the atmosphere, the detection starts when the sun is not or completely out of the horizon. As a result, the spectral...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N21/3504
CPCG01N21/3504
Inventor 王红梅张玉贵鲁之君
Owner NANTONG UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products