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Method for measuring half-wave voltage of M-Z type light intensity modulator

A technology of light intensity modulator and half-wave voltage, which is applied in the direction of measurement circuit and photometry using electric radiation detectors, can solve the problems of drift accuracy, high test system price, and low test cost, and achieve low cost, Avoid DC drift and high test accuracy

Active Publication Date: 2020-09-25
THE 44TH INST OF CHINA ELECTRONICS TECH GROUP CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The test result of the above-mentioned method 1 is accurate, but an oscilloscope is required, and the test system is expensive; method 2 uses an optical power meter instead of an oscilloscope, and the test cost is low, but due to the use of DC voltage measurement, the drift is serious and the accuracy is low

Method used

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  • Method for measuring half-wave voltage of M-Z type light intensity modulator
  • Method for measuring half-wave voltage of M-Z type light intensity modulator
  • Method for measuring half-wave voltage of M-Z type light intensity modulator

Examples

Experimental program
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Embodiment 1

[0042] Such as image 3 As shown, a kind of embodiment 1 of the measuring method of M-Z type optical intensity modulator half-wave voltage comprises the following steps:

[0043] Step S1, such as Figure 4 As shown, the input optical port of the M-Z optical intensity modulator to be tested is connected to the light source through the optical fiber, the output optical port is connected to the optical power meter through the optical fiber, and the voltage port is electrically connected to the waveform generator;

[0044] Step S2, applying a DC bias voltage to the M-Z type optical intensity modulator to be tested through the waveform generator, and adjusting the DC bias voltage so that the output optical power of the M-Z type optical intensity modulator to be tested is located in the maximum value area, and the maximum value area is the output The area where the optical power value is greater than the half-power point is preferably the maximum point or near the maximum point; af...

Embodiment 2

[0073] Embodiment 2 of a method for measuring half-wave voltage of an M-Z type optical intensity modulator comprises the following steps:

[0074] Step S1', such as Figure 4 As shown, the input optical port of the M-Z optical intensity modulator to be tested is connected to the light source through the optical fiber, the output optical port is connected to the optical power meter through the optical fiber, and the voltage port is electrically connected to the waveform generator;

[0075] Step S2', apply a DC bias voltage to the M-Z type optical intensity modulator to be tested through the waveform generator, and adjust the DC bias voltage so that the output optical power of the M-Z type optical intensity modulator to be tested is located in the minimum value area, and the minimum value area is The area where the output optical power value is less than the half-power point is preferably the minimum point or the vicinity of the minimum point; after the M-Z type optical intensit...

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Abstract

The invention discloses a method for measuring the half-wave voltage of an M-Z type light intensity modulator, and the method comprises the steps: employing a light source, a light power meter and a waveform generator to measure the to-be-measured M-Z type light intensity modulator, and adjusting a DC bias voltage to enable the output light power of the to-be-measured M-Z type light intensity modulator to be located in a maximum value region; superposing a square wave signal with a peak-to-peak value of 0 on the basis of the DC bias voltage, gradually increasing the peak-to-peak value of the square wave signal to reduce the display value of the optical power meter to a minimum value, and finally calculating the half-wave voltage of the M-Z type light intensity modulator to be measured according to the current peak-to-peak value of the square wave signal. According to the invention, the square wave is superposed on the DC bias voltage to serve as the test signal, the influence of DC drift is effectively avoided through innovation of the test method, the half-wave voltage of the M-Z type light intensity modulator can be accurately measured by using the optical power meter, a high-precision oscilloscope is not needed, the cost of the test system is low, and the test precision is high.

Description

technical field [0001] The invention relates to the field of M-Z type light intensity modulators, in particular to a method for measuring half-wave voltage of M-Z type light intensity modulators. Background technique [0002] M-Z optical intensity modulator (Mach Zehnder optical intensity modulator) is an important device in optical fiber communication and optical fiber sensing, and can be used for carrier suppression, pulse generation, and pulse selection. The half-wave voltage is an important indicator of the M-Z type optical intensity modulator. There are two commonly used test methods for it: [0003] 1. Press figure 1 Connect the test system, the waveform generator outputs a sawtooth wave as the test signal, gradually increase the output signal voltage value of the waveform generator, so that the output waveform displayed by the oscilloscope appears two maximum points in sequence, and record the two maximum points corresponding to the waveform generator in sequence Th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J1/42G01J1/44
CPCG01J1/42G01J1/44
Inventor 李淼淼胡红坤华勇张鸿举吴巧
Owner THE 44TH INST OF CHINA ELECTRONICS TECH GROUP CORP