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Testing method, device and apparatus of complete machine system and storage medium

A testing method and system testing technology, which is applied to the testing of the whole machine system, the testing device of the whole machine system, and the field of computer-readable storage media. Test the effect and improve the effect of product image

Inactive Publication Date: 2020-10-02
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] All kinds of computing equipment, including PCs and servers, must be tested for the whole machine system before leaving the factory to check whether the performance of the computing equipment meets the standards. During the whole machine system test, the test equipment will control the equipment to be tested. Execute a general test program to obtain test results, but in the face of some personalized test items proposed by users, there is no mature test scheme in the prior art that can meet the test requirements for individualized test items proposed by users, and It is still only possible to test the routine test items, the test effect is poor, and it affects the product image

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  • Testing method, device and apparatus of complete machine system and storage medium
  • Testing method, device and apparatus of complete machine system and storage medium

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Embodiment Construction

[0041] The core of the present invention is to provide a test method for the complete machine system, which improves the test effect and product image, and because the application is applied to the processor, the degree of automation is high and the labor cost is low; another purpose of the present invention is to A test device, equipment and computer-readable storage medium for a complete system are provided, which improves the test effect and product image, and because the application is applied to a processor, the degree of automation is high and the labor cost is low.

[0042] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, bu...

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Abstract

The invention discloses a testing method of a complete machine system. According to the application, the software in the pre-created required software list (including the software required for performing the preset test item test in the to-be-tested computing device) can be downloaded, and a test data packet is generated according to the downloaded software under the condition of ensuring that thedownloaded software can complete the test of the whole system, therefore, the preset test items can be smoothly tested on the to-be-tested equipment by utilizing the test data packet, the test effectand the product image are improved, and the method is applied to the processor, so that the automation degree is relatively high, and the labor cost is relatively low. The invention further disclosesa testing device and apparatus of the complete machine system and a computer readable storage medium. The device and apparatus have the same beneficial effects as the testing method of the complete machine system.

Description

technical field [0001] The present invention relates to the field of computing equipment, in particular to a test method for a complete system, and also relates to a test device, equipment and a computer-readable storage medium for a complete system. Background technique [0002] All kinds of computing equipment, including PCs and servers, must be tested for the whole machine system before leaving the factory to check whether the performance of the computing equipment meets the standards. During the whole machine system test, the test equipment will control the equipment to be tested. Execute a general test program to obtain test results, but in the face of some personalized test items proposed by users, there is no mature test scheme in the prior art that can meet the test requirements for individualized test items proposed by users, and It is still only possible to test the routine test items, the test effect is poor, and it affects the product image. [0003] Therefore, ...

Claims

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/3688G06F11/3684
Inventor 石涛王笠
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD