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Mark point multi-angle scanning method, system and device

A scanning method and a technology of marking points, which are applied in the field of 3D scanners, can solve problems such as low accuracy of scanning results, unsuitability for industrial fields, and affecting the accuracy of 3D reconstruction models.

Pending Publication Date: 2020-10-27
SCANTECH (HANGZHOU) CO LTD
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Problems solved by technology

Therefore, the accuracy of marker point reconstruction directly affects the calculation of the marker point matching transformation relationship, thereby affecting the splicing accuracy of the reconstructed point cloud, and ultimately affecting the accuracy of the overall 3D reconstruction model
[0005] At present, the scanning of marked points, in the case of scanning at a single angle or a small number of angles, will increase the cumulative error of the stitching of the scanning as the scanning progresses, resulting in a very low accuracy of the final scanning result, which is not suitable for industrial fields.

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Embodiment Construction

[0042] The above and other technical features and advantages of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them.

[0043] see figure 1 , figure 2 as well as image 3 The multi-angle scanning method for marking points provided by Embodiment 1 of the present invention includes the following steps;

[0044] S100. Obtain the marker data of the scanned marker 2 under different viewing angles, and reconstruct the marker data to obtain marker reconstruction data;

[0045] S200. Determine the marker point plane according to the marker point reconstruction data, and divide the marker point plane into at least two angle regions 3;

[0046] S300. In the process of continuous scanning at different angles of view, project the center of the scanner instrument for each scan onto the marked point plane, and cal...

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Abstract

The invention discloses a mark point multi-angle scanning method, system and device. The method comprises the steps: obtaining the mark point data of a scanned mark point at different visual angles, carrying out the reconstruction of the mark point data, determining a mark point plane according to the mark point reconstruction data obtained through reconstruction, and dividing the mark point planeinto at least two angle regions; in the continuous scanning process at different visual angles, projecting the center of the scanner instrument scanned each time to a marking point plane, and calculating the number of times of falling into each angle area; counting the number of times of falling into each angle area in real time, and completing scanning when the number of times meets a preset threshold value of a corresponding angle; after scanning is completed, data structure conversion is conducted on the mark point reconstruction data, global optimization is conducted on the converted markpoint reconstruction data through a bundle adjustment method, and an obtained global optimal solution serves as a scanning result to be output. According to the invention, the splicing precision of the overall mark points can be improved, so that laser scanning can be better applied to the field of industrial measurement.

Description

technical field [0001] The invention relates to the technical field of three-dimensional scanners, in particular to a multi-angle scanning method, system and device for marking points. Background technique [0002] With the advancement of computer technology, automation technology and image processing technology, three-dimensional scanning and measurement technology based on structured light stereo vision has developed rapidly. The basic principle of structured light stereo vision is to use structured light projection to obtain the outline image of the measured object. Based on the principle of binocular vision, the local 3D information of the object is obtained after image matching, and then the overall 3D information of the object is obtained through point cloud splicing and reconstruction. Model. Structured light 3D scanning measurement has the advantages of fast speed, high precision, and convenient use. Aviation, medical and cultural relics and other industries. [0...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/521
CPCG06T7/521G06T2207/10028
Inventor 郑俊焦吾振冯敏翔
Owner SCANTECH (HANGZHOU) CO LTD
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