Chip capacitor detection equipment

Abstract

The invention belongs to the field of chip capacitor testing, particularly relates to chip capacitor detection equipment. The chip capacitor detection equipment comprises a feeding device, an electricperformance detection device, an electric performance defective product tray, an appearance detection device, a qualified product discharging device, a defective appearance tray, and a turntable conveying device, wherein the feeding device is used for feeding a chip capacitor; the electrical property detection device is used for detecting the electric performance of the chip capacitor, the electrical performance defective product tray is used for accommodating electrical performance defective products; the appearance detection device is used for testing the appearance of the chip capacitor; the qualified product discharging device is used for accommodating and conveying the qualified chip capacitor, the defective appearance tray is used for accommodating defective appearance products; andthe turntable conveying device is used for adsorbing and grabbing the chip capacitor and rotating and changing the station of the chip capacitor; the feeding device, the electric performance detection device, the electric performance defective product tray, the appearance detection device, the qualified product discharging device and the appearance defective product tray are circularly and sequentially arranged on the outer side of the turntable conveying device.

Description

technical field [0001] The invention belongs to the field of chip capacitor testing, and in particular relates to a chip capacitor testing device. Background technique [0002] After the chip capacitor is produced, it needs to be inspected for electrical performance and appearance. Most of the existing chip capacitors are inspected manually. The disadvantages of using labor are: 1. Low work efficiency; 2. High labor costs. 3. The production cycle is long. 4. The turnover cost is high. 5. High energy consumption. 6. The consistency of manual inspection standards is not high. [0003] Therefore, the prior art still needs to be improved and developed. Contents of the invention [0004] The technical problem to be solved by the present invention is to provide a chip capacitor detection device for the above-mentioned defects of the prior art, so as to solve the problems of low work efficiency, high cost, long production cycle, High turnover costs, high energy consumption,...

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a chip capacitor detection device for the above-mentioned defects of the prior art, so as to solve the problems of low work efficiency, high cost, long production cycle, Problems such as high turnover costs, high energy consumption, and low consistency of inspection standards

Images