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Method and device for automatically testing FC-AE-1553 communication protocol chip

A technology for automated testing and communication protocols, applied in digital transmission systems, electrical components, transmission systems, etc., can solve the problems of low test accuracy and efficiency, inability to test chips in all directions, time-consuming and labor-intensive, etc. Workload, the effect of reducing the error rate

Inactive Publication Date: 2020-12-01
BEIJING TASSON SCI & TECH CO LTD
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Problems solved by technology

[0004] Aiming at the above-mentioned technical problems in the prior art, the embodiment of the present disclosure proposes a method and device for automatic testing of FC-AE-1553 communication protocol chips, so as to solve the problems existing in the prior art that the chip cannot be fully tested and manual operation is required. , Time-consuming and labor-intensive, testing accuracy and low efficiency and other issues

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  • Method and device for automatically testing FC-AE-1553 communication protocol chip
  • Method and device for automatically testing FC-AE-1553 communication protocol chip
  • Method and device for automatically testing FC-AE-1553 communication protocol chip

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Embodiment Construction

[0038] In the following detailed description, numerous specific details of the disclosure are set forth by way of example in order to provide a thorough understanding of the relevant disclosure. It will be apparent, however, to one of ordinary skill in the art that the present disclosure may be practiced without these details. It should be understood that the terms "system", "device", "unit" and / or "module" used in the present disclosure are used as a means of distinguishing between different parts, elements, sections or assemblies at different levels in a sequential arrangement. method. However, these terms may be replaced by other expressions if the same purpose can be achieved by other expressions.

[0039] It will be understood that when a device, unit or module is referred to as being "on," "connected to" or "coupled to" another device, unit or module, it can be directly on the other device, unit or module. connected or coupled to or communicate with other devices, unit...

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Abstract

The embodiment of the invention discloses a method and a device for automatically testing an FC-AE-1553 communication protocol chip, and relates to the field of testing. The method comprises the following steps: setting a board card role, and generating configuration information; selecting a partition, and generating a task file in a specified folder; screening the task files according to the received keywords; loading the screened task files into a queue, and constructing a test scene; and issuing the test scene and the configuration information to an automatic service module, and automatically generating a test report and a log report.

Description

technical field [0001] The present disclosure relates to the field of testing, in particular to a method and device for automatic testing of FC-AE-1553 communication protocol chips. Background technique [0002] In the prior art, the optical fiber communication protocol chip is a single-chip digital integrated circuit, which is suitable for all network topologies, has multiple working modes, and can be configured as a network controller (hereinafter referred to as NC node, NetworkController), network terminal ( Hereinafter referred to as NT node, Network Terminal), network monitor (hereinafter referred to as NM node, Network Monitor), network terminal and monitor integration (NT+NM), matching terminal (hereinafter referred to as TM node, Matching Terminal) and Serdes mode, to realize High reliability, strong real-time data transmission function. [0003] Generally, for the testing of a specific chip like an optical fiber communication protocol chip, it is necessary to devel...

Claims

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Application Information

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IPC IPC(8): H04L12/26
CPCH04L43/06H04L43/50
Inventor 葛鹏陈泽新杜以清王雪倩李小波谢鹏赵志勇赵金强
Owner BEIJING TASSON SCI & TECH CO LTD
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