Method and equipment for measuring device internal surface temperature

Abstract

The invention discloses a method and equipment for measuring device internal surface temperature. The method comprises the steps: completing the calibration of a transmittance parameter of an infraredthermometer through a standard light window, completing the calibration of the emissivity of the infrared thermometer through adding a standard temperature measurement piece, keeping the emissivity,transmittance, standard light window and standard temperature measurement piece unchanged, maintaining device internal detection point constant temeprature, carrying out temperature measurment on a to-be-measured surface, wherein the measurement temeprature of theinfrared thermometer is the temerpature of theto-be-measured surface, wherein the above process is standard measurment; replacing a similar actual temperature measuring piece, and maintaining the device internal detection point temeprature to be constant, so that the actual temperature measuring piece surface temeprature is basicallyclose to the original standard temperature measuring piece infrared measurement temperature, and the process is approximate measurement; according to the two non-contact temperature measurement calibration methods, the influence of factors such as measurement precision, test distance, radiation process transmission medium, measurement process emissivity change, actual measurement conditions and the like are taken into consideration, and the measurement precision and the measurement efficiency are improved.

Description

technical field [0001] The invention relates to the technical field of infrared temperature measurement, and more specifically relates to a method and equipment for measuring the internal surface temperature of a device. Background technique [0002] Temperature measurement is usually divided into contact and non-contact measurement. The more traditional temperature measurement generally adopts the contact temperature measurement method, the main means are mercury thermometers, pressure thermometers, etc., which use the thermal expansion and contraction of the medium, and the thermocouple method, thermal resistance method, etc., which use the electrical parameters of the object to change with temperature, and Using stickers that change color with temperature, these temperature measurement technologies are mature and have been applied in various industries. In some applications, contact temperature measurement is restricted, and non-contact temperature measurement has obviou...

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Problems solved by technology

[0003] Infrared temperature measurement technology, there are two problems to be solved, one is to accurately measure the radiant energy from the surface of the measured object; the other is how to accurately represent the real temperature of the measured surface with radiant energy; in addition, measurement accuracy, test distance, The working dynamic range, the size of the target to be measured, the transmission medium in the radiation process, and the emissivity change in the measurement process, etc., all of these factors affect the accuracy and reliability of infrared temperature measurement.

[0004] The Chinese patent publication number is CN 109959454 A, which discloses the invention of "an infrared temperature measuring device, temperature measuring method and application for strong light irradiation on the surface". The invention provides an infrared temperature measurement device for strong light irradiation on the surfac...

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