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Projector calibration method based on secondary projection

A technology of secondary projection and calibration method, which is applied in the direction of instruments, image data processing, measuring devices, etc., can solve problems such as pattern interference, achieve high space utilization, good application value, and effective extraction

Active Publication Date: 2020-12-08
苏州东方克洛托光电技术有限公司
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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a projector calibration method based on secondary projection. The problem of mutual interference of calibration board patterns

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  • Projector calibration method based on secondary projection
  • Projector calibration method based on secondary projection
  • Projector calibration method based on secondary projection

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Embodiment Construction

[0028] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0029] The present invention mainly calibrates the projector in the digital grating projection three-dimensional measurement system through secondary projection, which solves the problem of mutual interference between the pattern projected on the calibration plate and the existing calibration plate pattern in the previous calibration process .

[0030] In the following, the present invention will be described in detail by taking the mark as a cross and the calibration plate as an example with a black circular feature point array on a white background.

[0031] Such as figure 1 As shown, the projector calibration method based on secondary projection of the present invention comprises the following steps:

[0032] Step 1. Input a projection pattern with a cross mark into the projector and project it onto the calibration board to ensure that all...

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Abstract

The invention relates to a projector calibration method based on secondary projection, and the method comprises the following steps: projecting a primary projection pattern with a mark to a calibration plate with feature points; obtaining a homography matrix of the projector plane and the calibration plate plane according to the coordinates of the feature point center in the world coordinate system and the pixel coordinates of the feature point center in the camera imaging plane, and the pixel coordinates of the mark center in the camera imaging plane and the coordinates of the mark center inthe projector plane; and generating a secondary projection pattern according to a plurality of position point arrays with known world coordinates, projecting the secondary projection pattern to the calibration plate, and acquiring an image to obtain a projection pattern and a calibration plate pattern without interference, thereby completing projector calibration. The method is effective and accurate in extraction of corresponding feature points.

Description

technical field [0001] The invention belongs to the technical field of grating projection three-dimensional measurement, and in particular relates to a projector calibration method based on secondary projection used in a digital grating projection three-dimensional measurement system. Background technique [0002] In the field of three-dimensional measurement, digital grating projection three-dimensional measurement technology is the main non-contact measurement method. Because of its advantages of high precision, high resolution, low cost and fast speed, it has been widely used in industrial inspection, cultural relic reconstruction, reverse engineering and other fields. Applications. The grating projection three-dimensional measurement technology is to project the sinusoidal grating pattern into the scene by the projector and collect the corresponding deformed grating pattern. This process links the depth information in the scene with the phase of the image. Then, the acq...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25G06T7/80
CPCG01B11/254G01B21/042G06T7/80
Inventor 韩希珍孙金霞杨建柏
Owner 苏州东方克洛托光电技术有限公司
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