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Multi-label marking method for defect report

A defect reporting and marking method technology, applied in the computer field, can solve the problems of insufficient label types and failure to meet multi-label data requirements, etc.

Active Publication Date: 2021-01-05
WUHAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, if you want to add labels to defect reports from cross-warehouses, how to filter and unify labels is a problem that label classification will encounter
The existing single-label methods have some work in the unification of labels, but the types of unified labels are not enough to meet the data requirements of multi-label

Method used

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  • Multi-label marking method for defect report
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  • Multi-label marking method for defect report

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Embodiment Construction

[0104] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are For some embodiments of the present invention, those skilled in the art can also obtain other drawings based on these drawings without creative work.

[0105] figure 1 It is a flow chart of the method of the present invention. Combine below Figure 1 to Figure 4 The specific embodiment of the present invention is introduced as a multi-label marking method for defect reports, including the following steps:

[0106] Step 1: Construct a defect report data set, construct a user-specified candidate label set according to the defect report data set, construct an initial multi-label training data set according to the user-specified candidate label set, and perfo...

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Abstract

The invention provides a multi-label marking method for a defect report. A to-be-selected label set is designated by a user, an initial multi-label training data set is constructed according to the set, and a first round of label completion is carried out through a manual completion method to obtain a multi-label training data set after the first round of completion; a second round of label completion is automatically performed by using a binary classification prediction method to obtain a multi-label training data set after the second round of label completion, and then a third round of labelcompletion is performed by using a manual completion method to obtain a final multi-label training data set; a text multi-class classification model is constructed based on a rapid text classifier algorithm, and training is carried out based on the final multi-label training data set to obtain a trained text multi-class model as a trained defect report label predictor; and the trained defect report label predictor is utilized to carry out multi-label marking on the defect report, and user feedback is collected to update prediction performance in real time. The present invention provides a method for efficiently predicting and tagging a plurality of tags for a defect report.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a multi-label marking method for defect reports. Background technique [0002] Defect reports play an important role in software development. The increasingly mature defect tracking system, along with the continuous improvement of defect report management capabilities, also provides more convenient defect report sorting services for modern software development. For example, GitHub, an all-in-one coding community, has integrated a Git-based version control system with a lightweight defect tracking system to provide convenient coding services. This bug report tracking system helps to log thousands of bug reports for many open source projects. [0003] A very important function of a bug report tracking system is to assign tags to bug reports. The tags of defect reports help developers to quickly classify or identify defect reports. [0004] In real projects, defect reports ofte...

Claims

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Application Information

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IPC IPC(8): G06F11/36G06K9/62
CPCG06F11/3692G06F18/214
Inventor 谢晓园陈崧强苏宇辉晋硕姬渊翔
Owner WUHAN UNIV