Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Phase shift method for grating stripe principal value phase extraction

A phase extraction and grating fringe technology, applied in the field of extended average phase shift, can solve problems such as cumbersome derivation process, restricting scholars' exploration and promotion, and lack of unified general mathematical expressions, so as to enhance operability and flexibility, and expand use. performance effect

Active Publication Date: 2021-01-05
XIAN UNIV OF POSTS & TELECOMM +1
View PDF3 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0023] From the basic principle analysis of the above-mentioned extended average phase shift technology, the derivation process is cumbersome and there is no unified general mathematical expression, which is different from the flexibility and The operability forms a strong contrast, which greatly restricts scholars' further exploration and promotion of this technology

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Phase shift method for grating stripe principal value phase extraction
  • Phase shift method for grating stripe principal value phase extraction
  • Phase shift method for grating stripe principal value phase extraction

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0069] The core process of this application is the general case calculation of the extended average phase shift, and the specific calculation formula is:

[0070]

[0071] In the formula: N—the number of phase shift steps;

[0072] N 0 — the base of the extended average phase-shifted fringes, N 0 =3 means Class A, N 0 =4 means Class B;

[0073] N m — the molecular subitem of the group m extended mean phase-shifted fringe image combination;

[0074] D. m - The denominator sub-term of the m-th group of extended mean phase-shifted fringe image combinations.

[0075] When N 0 When = 3, the extended average phase shift general case formula N of Class A m and D m There are the following four basic orthogonal vector diagram models and mathematical expressions, see Table 2 and attached figure 2 As shown, the pixel coordinates (x, y) are omitted for the convenience of writing and illustration.

[0076] Table 2 Four basic phase shift expressions of Class A

[0077]

...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a phase shift method for grating stripe principal value phase extraction, establishes a general situation calculation formula of extended average phase shift on the basis of theexisting extended average phase shift Class A and Class B algorithms, and relates to a judgment method of the extended average phase shift Class A and Class B algorithms. The invention discloses a method for determining molecules, denominators and corresponding coefficients in an extended average phase shift general situation calculation formula. According to the method, a general situation calculation formula of Schmit and Creath extended average phase shift is provided, and the defects of the technology are overcome; the principal value phase of any continuous N0 images in the N steps of extended average phase shift fringe images is not required to be calculated, computer programming can be performed on any number of extended average phase shift fringe images, and the operability and the flexibility of the method are enhanced; and compared with a standard N-step phase shift algorithm, the phase shift result of any phase shift step number can be carried out, and the use performance of the technology is expanded.

Description

technical field [0001] The invention belongs to the related field of optical three-dimensional measurement, and relates to a phase shift method for extracting the principal value phase of grating fringes, in particular to an extended average phase shift method, which can realize the rapid expansion and average phase shift fringe image of any number of steps. Accurately simulate simulations with principal value phase extraction. Background technique [0002] With the rapid development of cross-integration of computer vision measurement technology, information optics and microelectronics technology, the non-contact, easy-to-operate, high-precision and high-efficiency advantages of digital grating fringe projection three-dimensional measurement technology have become more and more prominent, and have been widely used. It is applied to many industries such as industrial inspection, medical treatment, anthropometry, digitalization of cultural relics, criminal investigation, and c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T7/62G06T7/41G06F17/14G06F17/11
CPCG06T7/41G06T7/62G06F17/147G06F17/11
Inventor 卢津李渊孙惠斌孔宪光王富平公衍超
Owner XIAN UNIV OF POSTS & TELECOMM
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com