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A full storage depth measurement method, digital oscilloscope, and storage medium

A technology of storage depth and measurement method, applied in digital variable display, digital variable/waveform display, measuring device, etc., can solve problems such as loss of measurement accuracy, tight processor memory, and reduced waveform refresh rate

Active Publication Date: 2021-03-30
SHENZHEN CITY SIGLENT TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Existing oscilloscopes still have some problems when processing the collected data with full storage depth: (1) Data collection needs to be paused when the measurement is started, collection needs to be stopped when the data to be measured is read, and the data to be measured needs to be stopped after reading the data to be measured Start the acquisition after the data is collected, which will make the time to stop the acquisition longer when the amount of read data is large, and you will see periodic pauses in the waveform refresh. During the period of stopping the acquisition, abnormal signals may be missed and cause waveform The refresh rate is reduced, which affects the user's experience with the oscilloscope
(2) The oscilloscope is limited by the processor's processing power, memory capacity and reading bandwidth. The length of data actually used for measurement is limited, which is much smaller than the amount of data collected by the oscilloscope. If the collected raw data is compressed and measured, it will affect Measurement accuracy, and excessive occupation of processor memory may lead to inaccurate measurements. The storage depth of mainstream oscilloscopes is more than a few hundred megabytes. Some measurement items also need to read data from multiple channels, and the amount of data will increase. Doubling, which will inevitably lead to processor memory shortage. If the original data is compressed and then measured in order to save memory and reduce data reading time, the measurement accuracy will be lost.
(3) The measurement algorithm needs to count a large amount of data, compare levels, and search for effective rising or falling edges. If software processing is used entirely, it will take a lot of time. Some oscilloscope manufacturers adopt a processing method of only measuring the searched edge. If there are many different cycle values ​​in the collected waveform, measuring only one of the cycle values ​​will reduce the rationality of the measurement results; in addition, some oscilloscope manufacturers choose to compress the data before measuring, so that The problem is that the measured value cannot reflect the real situation of the collected data, and the compression method will lead to the measurement error of the measurement items in the horizontal direction.
(4) The calculation of the measurement items in the current measurement plan is completed by software, and there is a problem of slow measurement speed. For example, the refresh rate of the oscilloscope is above 100,000 frames per second, but only a small amount of collected data is actually used for measurement. Partly, many collected frame data are "ignored". If the measurement speed can be increased, the data can be effectively used to obtain more accurate and comprehensive measurement results

Method used

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  • A full storage depth measurement method, digital oscilloscope, and storage medium
  • A full storage depth measurement method, digital oscilloscope, and storage medium
  • A full storage depth measurement method, digital oscilloscope, and storage medium

Examples

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Embodiment 1

[0036] Please refer to figure 1 , a digital oscilloscope is disclosed in this embodiment, which mainly includes a data memory 11 , a measurement memory 12 , a first processing unit 13 , a second processing unit 14 and a display 15 .

[0037] The data memory 11 can be a RAM type memory, which supports writing and reading of data, so the data memory 11 here is used to store the collected data of the signal in the form of data frames, and the collected data can be converted by an analog-to-digital converter (ADC) The analog signal is obtained by sampling. It can be understood that the digital oscilloscope has a very high waveform refresh rate, and each refresh only needs to process one frame of collected data, so when the collected data is stored in the form of a data frame, it is beneficial to the data reading operation.

[0038] The measurement memory 12 can also be a RAM type memory, which supports writing and reading of data, and the measurement memory 12 here is used to st...

Embodiment 3

[0092] On the basis of the full memory depth measurement method disclosed in the second embodiment, a digital oscilloscope is disclosed in this embodiment.

[0093] Please refer to Figure 9 , the digital oscilloscope 3 includes a memory 31 and a processor 32 . Wherein, the memory 31 can be regarded as a computer-readable storage medium for storing a program, and the program can be a program code corresponding to the method for measuring the full storage depth in the second embodiment.

[0094] The processor 32 is connected with the memory 31, and is used for realizing the full memory depth measurement method by executing the program stored in the memory 31. Then, the functions implemented by the processor 32 can refer to steps S210-S240 in the second embodiment, and refer to Figure 3 to Figure 5 The steps disclosed in , will not be described in detail here.

[0095] Those skilled in the art can understand that all or part of the functions of the various methods in the for...

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Abstract

The application relates to a full storage depth measurement method, a digital oscilloscope, and a storage medium, wherein the full storage depth measurement method includes: acquiring a frame of acquisition data, constructing a signal waveform according to the acquisition data, and obtaining waveform data; separately storing the waveform data , and preprocess the waveform data to obtain the first parameter information; reprocess the separately stored waveform data according to the first parameter information to obtain the second parameter information; map the waveform data through parallel processing, and form the waveform image And the corresponding first parameter information and second parameter information are image displayed. The technical solution optimizes the measurement process and measurement speed, reduces the limitations on the processing power of the processor, memory capacity and reading bandwidth, and can achieve full memory depth measurement without compressing the original sampling data, which is conducive to ensuring the accuracy of the oscilloscope signal measurement. measurement accuracy.

Description

technical field [0001] The invention relates to the technical field of oscilloscopes, in particular to a method for measuring full storage depth, a digital oscilloscope, and a storage medium. Background technique [0002] Oscilloscope is an indispensable tool for designing, manufacturing and repairing electronic equipment. Today’s oscilloscopes are mostly digital oscilloscopes, which are becoming more and more popular because of their waveform triggering, storage, display, measurement, analysis and other functions. With the development of technology and market demand Rapidly developing, digital oscilloscopes are regarded as the eyes of engineers, and they will be used as a necessary tool to meet the measurement challenges of engineers. As the sampling rate and storage depth of oscilloscopes are getting higher and higher, the data used for measurement has also doubled. For example, the storage depth of the current mainstream oscilloscopes has reached more than 200M. How to qu...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F3/0482G06K9/00G01R13/02
CPCG06F3/0482G01R13/0209G06F2218/10
Inventor 郑文明刘仲胜郭宇昊
Owner SHENZHEN CITY SIGLENT TECH
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