Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

High-speed evanescent field frequency shift super-resolution microscopic imaging system and imaging method

A microscopic imaging and evanescent field technology, which is applied in the field of super-resolution microscopy, can solve the problems of limiting the imaging speed of imaging methods and unfavorable acquisition of dynamic images with high frame rates, so as to improve the image acquisition speed, improve the imaging speed, and reduce the The effect of the number of image acquisitions

Active Publication Date: 2021-01-12
ZHEJIANG UNIV
View PDF4 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, each image acquisition process requires a certain camera integration time, which limits the imaging speed of this imaging method and is not conducive to obtaining dynamic images with high frame rates.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High-speed evanescent field frequency shift super-resolution microscopic imaging system and imaging method
  • High-speed evanescent field frequency shift super-resolution microscopic imaging system and imaging method
  • High-speed evanescent field frequency shift super-resolution microscopic imaging system and imaging method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0059] Taking the double-channel sub-wavelength structure of "ZJU" as a sample, the super-resolution image reconstruction process is realized as an example, in which the distance between each side of the sample is 144nm.

[0060] Such as figure 1 As shown, the present invention provides an optical system structure for fast evanescent field shift frequency super-resolution microscopic imaging, the optical system structure includes:

[0061] (1) The optoelectronic integrated evanescent field frequency-shift imaging chip is used to support the micro-nano-sized sample to be observed and generate a regulated evanescent field to illuminate the sample; there is a circle of luminous multi-color LEDs on the surface of the chip, forming an octagon , LEDs on each side can be individually controlled to emit light; LEDs are mixed with quantum dots with three band gaps, and the wavelengths of the three colors of light are: 405nm, 532nm, and 700nm.

[0062] (2) The light emission control un...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a high-speed evanescent field frequency shift super-resolution microscopic imaging system and imaging method, and the method comprises the steps: employing an on-chip light-emitting device to generate evanescent fields with three wavelengths transmitted in the same direction at the same time, and employing a color camera to collect a frequency shift image generated by the three-wavelength evanescent fields which illuminate in the same direction at the same time, wherein the three wavelengths correspond to frequency shift signals of three wave bands of red, green and blue, and the illumination of each wavelength has different frequency shift amounts. In the image reconstruction process, multi-wavelength information shot at the same time is separated out to be subjected to interpolation processing, and therefore sample information with different frequency shift amounts and different illumination directions is obtained. And finally, image reconstruction is carriedout, high-frequency and low-frequency spectrums of the sample in different directions are spliced by using a splicing algorithm in a spectrum space, and finally, a high-resolution image breaking through the optical diffraction limit of the traditional microscope is recovered. According to the invention, under the condition of sacrificing a certain image sampling rate, the image acquisition quantity of the evanescent field frequency shift super-resolution method can be effectively reduced, and the imaging speed is improved.

Description

technical field [0001] The invention relates to the field of super-resolution microscopy, in particular to a high-speed evanescent field frequency shift super-resolution microscopic imaging system and imaging method. Background technique [0002] The traditional optical system is limited by Abbe's diffraction limit, and its imaging resolution has a certain limit. In order to break through the resolution limit of the optical microscopy system, a series of fluorescent labeling and non-fluorescent labeling methods have been proposed. Among them, the frequency-shifting super-resolution microscopy imaging technology breaks the bandwidth limitation of traditional imaging systems and detector devices, and shows the advantages of fast and large field of view imaging. Frequency-shifting label-free super-resolution microscopy does not require fluorescent labels, and can achieve super-resolution imaging of non-biological samples, which has broad application prospects. [0003] The ev...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G02B27/58G02B21/36G02B21/06
CPCG02B27/58G02B21/367G02B21/06
Inventor 杨青汤明炜刘旭
Owner ZHEJIANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products