Multi-channel scanning type temperature measuring device
A temperature measurement, scanning technology, used in measuring devices, thermometers, measuring heat, etc.
Active Publication Date: 2021-02-02
武汉微环控技术有限公司
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[0003]Aiming at the defects of the prior art, the purpose of the present invention is to provide a multi-channel scanning temperature measurement device, aiming to solve the temperature measurement of mK or even higher precision The problem
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[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0029] The present invention utilizes the characteristics of the thermistor, and adds a standard resistance to compare and measure it, uses a constant current source to excite the two, uses an integrated operational amplifier to amplify the voltage at both ends of the two, and further uses an ADC to collect and pass through the operational amplifier. And the filtered voltage, the obtained digital quantity is transmitted to the main control chip for calculation, and the final temperature result is displayed.
[0030] As mentioned above, the thermistor and the standard resistance are used for compara...
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The invention provides a multi-channel scanning type temperature measuring device which comprises the following steps: introducing two ADCs to simultaneously acquire voltages at two ends of a standardresistor and a thermistor through a double-ADC cross sampling measuring method so as to eliminate errors caused by time-sharing acquisition, but introducing the two ADCs to simultaneously introduce errors caused by different performances of the two ADCs, and therefore, a cross sampling method is adopted, the first ADC collects voltages at two ends of the standard resistor, and the second ADC collects voltages at two ends of the thermistor; and then the first ADC collects the voltages at the two ends of the thermistor, and the second ADC collects the voltages at the two ends of the standard resistor, so that errors caused by introduction of the two ADCs are reduced. Meanwhile, technical means such as introduction of standard resistance for comparison measurement, a constant-current sourcereversing method, a smooth filtering method and setting of isolation are combined and used. According to the invention, errors caused by unstable output current of the constant-current source in the process of comparing and measuring the standard resistor and the thermistor by the single ADC in a time-sharing manner are eliminated, and the design of the constant-current source is simplified at thesame time.
Description
technical field [0001] The invention belongs to the technical field of temperature measurement, and more specifically relates to a multi-channel scanning temperature measurement device. Background technique [0002] The current circuit design using a thermistor for temperature measurement adopts the basic principle of Ohm's law. The resistance value of the resistor is obtained by measuring the voltage across the thermistor, and then realized according to the characteristics of the thermistor's resistance change with temperature. Measurement of temperature. However, the implementation methods are not exactly the same. In order to obtain high-precision temperature measurement values in the prior art, methods such as introducing standard resistance for comparison measurement, constant current source reverse method, and algorithm optimization are used to eliminate measurement errors. However, these technical means The eliminated errors are limited, and the temperature measure...
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IPC IPC(8): G01K7/25
CPCG01K7/25
Inventor 李小平徐毅之贾留鹏王锦春
Owner 武汉微环控技术有限公司