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Oscilloscope for electronic engineering measurement

A technology of electronic engineering and oscilloscope, applied in the direction of measuring device, measuring electrical variable, measuring device casing, etc., can solve the problems of high temperature heating of internal components, difficult measurement of electronic engineering, easy damage of internal components, etc. High, solve the effect of poor shock absorption, easy to carry

Inactive Publication Date: 2021-03-09
HANGZHOU KUANFU TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is: in order to solve the problem that the existing oscilloscope is not easy to carry, takes up a lot of space, makes the measurement of electronic engineering more difficult, the heat dissipation effect is poor, and the internal components are easily heated by high temperature, the shock absorption effect is poor, and the internal components The problem of easy damage due to collision, the invention provides an oscilloscope for electronic engineering measurement

Method used

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  • Oscilloscope for electronic engineering measurement
  • Oscilloscope for electronic engineering measurement
  • Oscilloscope for electronic engineering measurement

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] see Figure 1-4 , an oscilloscope for electronic engineering measurement, comprising an oscilloscope main body 1, a display 3 is fixedly connected to the front side of the oscilloscope main body 1, a button 6 is provided on one side of the display 3, an adjuster 5 is provided on one side of the button 6, and an adjuster 5 is provided on one side of the button 6 The bottom is provided with a data transmission port 4, the top of the oscilloscope main body 1 is fixedly connected with a top cover 7, and the top of the top cover 7 is provided with a placement groove 21, and a handle 8 is provided inside the placement groove 21, and one end of the handle 8 is connected with a pin for rotation 24. The outer wall of the pin shaft 24 is provided with a spring 22, and one end of the spring 22 is fixedly connected with a fixture 23, and one side of the main body 1 of the oscilloscope is provided with a ventilation window 9.

[0030] In this embodiment, through the cooperative arra...

Embodiment 2

[0032] see figure 1 and 2 , this embodiment is further optimized on the basis of Embodiment 1, specifically, one side of the ventilation window 9 is provided with a casing 18, the casing 18 is arranged inside the oscilloscope main body 1, and the bottom end of the casing 18 is fixedly connected with Fin16.

[0033] Specifically, a copper pipe 15 is fixedly connected to one side of the casing 18 , and a connection wire 19 is fixedly connected to the other side of the casing 18 , and a fan 17 is provided inside the casing 18 .

[0034] Specifically, one end of the copper pipe 15 is fixedly connected to the heat conduction base 12 , the top end of the heat conduction base 12 is fixedly connected to the first heat conduction medium 13 , and one side of the copper pipe 15 is fixedly connected to the vapor chamber 14 .

[0035] Specifically, there are multiple copper pipes 15, and there are two heat-conducting bases 12, the top of one heat-conducting base 12 is fixedly connected w...

Embodiment 3

[0038] see Figure 4 , this embodiment is optimized as follows on the basis of Example 1 or Example 2. Specifically, the bottom end of the oscilloscope main body 1 is provided with a groove, the bottom end of the groove is slidably connected with a fixed base 2, and the top end of the fixed base 2 A crossbeam 27 is fixedly connected.

[0039] Specifically, both ends of the beam 27 are movably connected with rollers 26 , the middle part of the top end of the beam 27 is fixedly connected with a second shock absorber 29 , and the top of the second shock absorber 29 is fixedly connected with a two-way connector 30 .

[0040] Specifically, a baffle 28 is movably connected to the inside of the two-way connector 30 , one side of the baffle 28 is fixedly connected to the first shock absorber 25 , and the roller 26 is rollingly connected to the other side of the baffle 28 .

[0041] In this embodiment, through the cooperation between the fixed base 2, the beam 27, the baffle plate 28,...

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Abstract

The invention discloses an oscilloscope for electronic engineering measurement, which relates to the technical field of oscilloscopes and comprises an oscilloscope body, a display is fixedly connectedto the front side of the oscilloscope body, a button is arranged on one side of the display, an adjuster is arranged on one side of the button, and a data transmission port is formed in the bottom ofthe button. The top end of the oscilloscope body is fixedly connected with a top cover, the top end of the top cover is provided with a placement groove, the placement groove is internally provided with a handle, one end of the handle is rotatably connected with a pin shaft, the outer wall of the pin shaft is provided with a spring, one end of the spring is fixedly connected with a clamp, and oneside of the oscilloscope body is provided with a ventilation window. According to the oscilloscope, the oscilloscope body, the top cover, the clamp and the pin shaft are arranged in a matched mode, so that the oscilloscope is convenient to carry by workers, occupied space is saved, measurement of electronic engineering is facilitated, and the problem that an existing oscilloscope is inconvenientto carry and large in occupied space, and consequently measurement of the electronic engineering is difficult is solved.

Description

technical field [0001] The invention relates to the technical field of oscilloscopes, in particular to an oscilloscope for electronic engineering measurement. Background technique [0002] An oscilloscope is an electronic measuring instrument with a wide range of uses. It can convert invisible electrical signals into visible images, which is convenient for people to study the changing process of various electrical phenomena. The oscilloscope can be used to observe the waveform curves of various signal amplitudes changing with time, and it can also be used to test various electric quantities, such as voltage, current, frequency, phase difference, amplitude modulation, etc. However, the existing oscilloscopes cannot measure the waveform very well. Although there are scales on the screen, the distance between the scales is large, and the measurement accuracy is low, which cannot meet the precise measurement and comparative research on electronic waveforms. [0003] In the Chi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R13/00G01R1/04H05K7/20
CPCG01R1/04G01R13/00H05K7/20136H05K7/2039
Inventor 郑东
Owner HANGZHOU KUANFU TECH
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