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Switching device for optical module aging test, optical module aging device and method

An optical module testing and switching device technology, applied in the field of optical communication, can solve the problems of chip damage, aggravated impact force, ignition and other problems inside the optical module

Active Publication Date: 2021-03-19
深圳市迅特通信技术股份有限公司 +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] For the traditional optical module burn-in board, after plugging in the power connector and turning on the mechanical switch, all the optical modules on a burn-in board are powered on at the same time at the same time, because there is a surge current in the pluggable optical module (although there is a slow start circuit inside the optical module, It can only slow down the inrush current to a certain extent, but it cannot completely eliminate it), the inrush current of so many optical modules stacked together will cause a great impact on the power supply equipment, and because multiple optical modules are connected at the same time At the instant of power on, the voltage drop on the power line is too large, which will cause the optical module to fail to obtain a suitable power supply voltage, which will cause damage to the internal chip of the optical module. After the aging is over, switch the mechanical switch to the off state. At this time, all The optical module is powered off at the same time. According to U=-L*(di / dt), a huge reverse impulse voltage will be generated at this time. Even if some high-end power supplies have better surge suppression circuits, it is difficult to Can withstand the frequent impact of surge current, not to mention that some power equipment itself has weak anti-surge capability, coupled with the increasing power consumption of optical modules, the surge current of individual optical modules when they are powered on / off It also increases significantly, which exacerbates the destructive impact. Furthermore, when the mechanical switch is opened and closed, due to the instantaneous high voltage, an arc will be generated, resulting in a sparking phenomenon.
[0004] Another significant disadvantage of the traditional burn-in board solution is that it is impossible to ensure that the power supply voltage of each optical module is stable at 3.3v

Method used

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  • Switching device for optical module aging test, optical module aging device and method
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  • Switching device for optical module aging test, optical module aging device and method

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[0061] In order to better explain the present invention and facilitate understanding, the present invention will be described in detail below through specific embodiments in conjunction with the accompanying drawings.

[0062] In order to better understand the above technical solutions, the following will describe exemplary embodiments of the present invention in more detail with reference to the accompanying drawings. Although exemplary embodiments of the present invention are shown in the drawings, it should be understood that the invention may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that the present invention can be more clearly and thoroughly understood, and the scope of the present invention can be fully conveyed to those skilled in the art.

[0063] In the embodiment of the present invention, port, interface and terminal all refer to the interface of the circuit or the pin of th...

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Abstract

The invention relates to a switching device for an optical module aging test, an optical module aging device and method, wherein the switching device is used for converting the voltage of an aging power supply into a power supply voltage corresponding to each optical module in a plurality of optical modules connected in parallel, and achieving the one-by-one power-on and communication of all optical modules according to the testing logic of the optical modules; a processing module sequentially enables each voltage reduction module connected with the corresponding optical module according to apower-on signal of the switching device and optical module test logic, so that the optical modules are powered on by the voltage reduction modules one by one; and the processing module receives a testcompletion instruction of a control panel, disconnects the first switch module to realize power failure of the switching device, and closes the voltage output port of each voltage reduction module insequence according to the optical module test logic so as to disconnect the optical modules one by one. The switching device provided by the invention is applied to the aging test of the optical modules, and can solve the problem of surge current when existing optical modules are powered on / off.

Description

technical field [0001] The invention relates to the technical field of optical communication, in particular to an adapter device for optical module aging test, an optical module aging device and a method. Background technique [0002] With the development and widespread use of optical communication technology, the stability and reliability of optical networks are more prominent. Since the quality of optical networks is largely affected by the quality of optical modules, during mass production, the optical modules must be Aging, early exposure of optical modules that will appear abnormal before the end of life. [0003] For the traditional optical module burn-in board, after plugging in the power connector and turning on the mechanical switch, all the optical modules on a burn-in board are powered on at the same time at the same time, because there is a surge current in the pluggable optical module (although there is a slow start circuit inside the optical module, It can onl...

Claims

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 蒋昌明李江华郑波孙鼎张伟魏志坚过开甲
Owner 深圳市迅特通信技术股份有限公司
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