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Power tube test crimping device

A power tube and test pressure technology, which is applied in the field of power tube test crimping devices, to reduce the risk of sintering and improve test efficiency

Pending Publication Date: 2021-03-23
南京国博电子股份有限公司 +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The design performance of the power device tube is the core of the RF power amplifier. At present, the mainstream design is to use GaN electron mobility transistors. Due to its wide bandgap semiconductor characteristics, it has good linearity, power and bandwidth. The test power tube cannot be sintered in some occasions and has high requirements for crimping. It is of great significance to use a special test crimping device to improve heat dissipation and test efficiency.

Method used

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Embodiment Construction

[0031] The present invention is described in further detail now in conjunction with accompanying drawing. These drawings are all simplified schematic diagrams, which only illustrate the basic structure of the present invention in a schematic manner, so they only show the configurations related to the present invention.

[0032] In the prior art, when the power tube is placed in the groove of the test base, the conventional method is to use welding technology so that the power tube and the test base are integrated, but in some occasions the sintering problem cannot occur when the power tube is tested. Therefore, it is necessary to design a crimping device that matches the power tube. figure 1 As shown, the present application provides a matching power tube test crimping device, including a test base, a groove is opened on the surface of the test base 102, and the power tube 103 is placed in the groove; the test pressure is covered on the surface of the power tube. Connect the ...

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Abstract

The invention relates to a power tube test crimping device, which comprises a test base, wherein a groove is formed in the surface of the test base, a power tube is arranged in the groove, the surfaceof the power tube is covered with a test crimping device body, and the test crimping device body presses the pins and tube caps of the power tube, so that the power tube is fixed in the groove in thesurface of the test base. According to the test crimping device body provided by the invention, tight fitting of the power tube and the test base can be realized, the test efficiency is improved, andthe test crimping device body can dissipate heat automatically, so that the influence on the radio frequency performance of the power tube is avoided.

Description

technical field [0001] The invention relates to a power tube test crimping device, which belongs to the technical field of wireless communication. Background technique [0002] With the development of wireless communication technology, RF power amplifier has become the key technology of wireless transmission system. On the one hand, it needs to output high power to the external load. The efficiency of the RF power amplifier, so that its energy consumption is reduced, is critical to the stability and sustainability of the overall system. [0003] The design performance of the power device tube is the core of the RF power amplifier. At present, the mainstream design is to use GaN electron mobility transistors. Due to its wide bandgap semiconductor characteristics, it has good linearity, power and bandwidth. The test power tube cannot be sintered during testing in some occasions and has high requirements for crimping. It is of great significance to use a special test crimping ...

Claims

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Application Information

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IPC IPC(8): G01R1/04G01R31/26
CPCG01R1/0408G01R31/26
Inventor 李志强朱建彬曾瑞锋陈志勇
Owner 南京国博电子股份有限公司
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