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A kind of acquisition method of grain orientation imaging map

A technology of grain orientation and acquisition method, applied in instruments, microscopes, optics, etc., can solve problems such as poor universality, achieve low cost, and solve the effect of increasing production cost

Active Publication Date: 2022-08-02
CHINA HANGFA GUIZHOU LIYANG AVIATION POWER CO LTD
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Problems solved by technology

[0003] Optical digital microscopes are equipped in most laboratories. If electron backscatter diffraction technology is used, scanning electron microscope and electron backscatter diffraction probe equipment need to be purchased at the same time. The whole set of equipment is about 1 million; The cost is about 100,000. Different alloys need to develop different dyeing methods, and the universality is poor.

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  • A kind of acquisition method of grain orientation imaging map
  • A kind of acquisition method of grain orientation imaging map
  • A kind of acquisition method of grain orientation imaging map

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Embodiment Construction

[0027] The technical solutions of the present invention are further described below, but the claimed scope is not limited to the description.

[0028] An auxiliary device for obtaining a crystal grain orientation imaging map of the present invention comprises: upper, middle and lower three-layer annular cavity bodies 1 fixed in a stepped manner, and the inner diameter of the three-layer annular cavity 1 decreases sequentially from bottom to top, The inner wall of the cavity 1 of the lower layer is fixedly connected with the outer wall of the cavity 1 of the middle layer, and the inner wall of the cavity 1 of the middle layer is fixedly connected to the outer wall of the cavity 1 of the upper layer;

[0029] The cavity 1 includes an outer surface body 11 , an inner surface body 12 , a top surface body 13 , and a bottom surface body 14 , which are sequentially fixed and closed to form a cavity; Ring surface light source;

[0030] The three-layer cavity 1 is equipped with an ann...

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Abstract

The invention discloses a method for acquiring a crystal grain orientation imaging map, comprising: upper, middle and lower three-layer annular cavities fixed sequentially in a stepped manner; , top surface body, bottom surface body; the bottom surface body is made of white translucent material; the three-layer cavity is equipped with annular lamp bodies of different primary colors; The light irradiated on the surface of the alloy grains on the stage, and then the optical digital microscope obtained a large-area grain orientation imaging map. Because the grains with different orientations reflect the light and dark of the three layers of light sources with different colors, the grains with different orientations have different colors and the grains with the same orientation have the same color in the acquired image. The cost of research and development of backscatter diffraction equipment or phase dyeing technology leads to the problem of increased production cost, the problem of low efficiency of electron backscatter diffraction, and the problem of poor universality of the phase dyeing technology.

Description

technical field [0001] The invention relates to an auxiliary device and an acquisition method for obtaining a crystal grain orientation imaging map, belonging to the technical field of alloy crystal grain detection. Background technique [0002] At present, the acquisition technology of orientation imaging map mainly includes electron backscatter diffraction (EBSD) and phase dyeing technology. Electron backscatter diffraction technology detects the Kikuchi pattern at each point, and then draws the whole orientation image. The sample preparation steps are complicated and time-consuming, and at the same time Because the obtained grain image area is limited for a long time, the detection efficiency of alloy grains is low. The phase dyeing technique can only obtain the orientation image of a small number of phases, and it is still in the research stage, and there are few effective applications. [0003] Optical digital microscopes are equipped in most laboratories. If electroni...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B21/08G02B21/00
CPCG02B21/084G02B21/0004
Inventor 杨玉川李永斌李巍熊勇汤浩
Owner CHINA HANGFA GUIZHOU LIYANG AVIATION POWER CO LTD
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