High-speed PON/optical module receiving avalanche diode test method
An avalanche diode and testing method technology, which is applied in photometry, optical radiation measurement, single semiconductor device testing, etc., can solve problems such as limited sensitivity, and achieve the effect of avoiding unnecessary losses
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[0037] In the prior art, the commonly used optical power meter mainly uses the resistance value or current change of the photosensitive or heat-sensitive device to realize the measurement of optical power, that is, when facing light sources with different powers, it will output different currents with the change of optical power , to detect the optical power through the current. The advantage of this kind of optical power meter is that the spectral response curve is flat and the cost is low, but its sensitivity is very limited, and generally it can only respond to the pw level at most. Even the improved light detection device based on avalanche photodiode (APD) can only be used for photon counting, detecting photon "presence" or "absence", but cannot directly distinguish the strength of the light signal, so how to use the APD in the avalanche state Power detection with high sensitivity and improvement of detection accuracy are very important issues at present.
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