Pattern compiling and downloading test method and system for ATE equipment

Abstract

The invention discloses a pattern compiling and downloading test method and system for ATE equipment, and the method comprises a compiling step: analyzing a pattern sequence file, obtaining a used board card slot and a corresponding Pin pin on the ATE equipment, carrying out the butt-joint conversion of a circuit behavior sequence according to a Pin pin definition file, partitioning the data into input circuit information, output circuit information, control circuit information and comparison circuit information, and generating corresponding compiled files; a test step: reading data in the input circuit information and the comparison circuit information by the Pattern board according to the compiled file, processing the data by the PE chip, and sending the processed data to the tested chip; enabling the PE chip to read the pin output of the tested chip through the data pin channel, processing the pin output and outputting the processed pin output to the Pattern board, and enabling the Pattern board to acquire a test result according to the output circuit information and the data in the comparison circuit information and storing the test result into the pin test register; and enabling the upper computer to perform statistical operation on the chip yield. According to the invention, no Pin range limitation exists, and the utilization rate of board card test channel resources and the parallel test efficiency are improved.

Description

technical field [0001] The invention relates to the technical field of chip testing of ATE equipment, in particular to a method and system for compiling and downloading patterns of ATE equipment. Background technique [0002] In the field of testing of semiconductor automatic test equipment (Automatic Test Equipment, referred to as ATE), the test results of chip pins are usually compared with the pin target results, and the test is performed after the semiconductor device is manufactured, or to help determine the cause of the failure; but now Some comparisons are not accurate enough. The comparison between the test results of the existing chip pins and the pin target results is not accurate enough. The test results of the board through the digital channel can only be returned in units of boards, and the exact pin cannot be returned. As a result, when it comes to the host computer, it is difficult to test multiple chips of a single board at the same time. Contents of the in...

AI Technical Summary

Problems solved by technology

[0002] In the field of testing of semiconductor automatic test equipment (Automatic Test Equipment, referred to as ATE), the test results of chip pins are usually compared with the pin target results, and the test is performed after the semiconductor device is manufactured, or to help determine the cause of the failure; but now Some comparisons are not accurate enough. The comparison between the test results of the existing chip pins and the pin target results is not accurate enough. The test results of the board through the digital channel can only be returned in units of boards, and the exact pin cannot be returned. As a result, it is difficult to test multiple chips of a single board at the same time when it reaches the host computer

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