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A sampling test method and system based on multi-station serial testing

A test station and a part of the technology, applied in the field of random testing methods and systems based on multi-station serial testing, can solve the problems of inefficient detection efficiency and inability to use multi-station serial testing, etc., to achieve efficient chip quality testing, improve chip test quality, time-saving effect

Active Publication Date: 2021-05-28
南京派格测控科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the stacked chip silicon-based quality detection device can only be used for single-station detection, and cannot be used for multi-station serial detection, and the detection efficiency is not high
[0005] At present, the existing technology has not provided a random testing method that can predict the test results in the context of multi-station concurrent testing

Method used

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  • A sampling test method and system based on multi-station serial testing
  • A sampling test method and system based on multi-station serial testing

Examples

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Embodiment 1

[0031] Aiming at the deficiencies of the prior art, the present invention provides a random testing method based on multi-station serial testing. The method at least includes: when at least two testing stations perform different conventional tests on chips, when the number of qualified chips reaches During random index testing, each of the test stations conducts a quality test on the chips currently undergoing routine testing.

[0032] The way to determine the sampling index is m=n-a+b. Among them, m represents the sampling index, n represents the number of chips tested in one round; a represents the number of test stations; b represents the serial number of the test stations.

[0033] When there are m chips that pass the test, the chips being tested by the testing station continue to perform quality testing after the routine testing until the end of a round.

[0034] For example, the most common number of test stations is 2. The test stations are the first test station site...

Embodiment 2

[0083] This embodiment is a further improvement on Embodiment 1, and repeated content will not be repeated here.

[0084] The present invention also provides a random testing system based on multi-station serial testing, which is used to execute the random testing method based on multi-station serial testing of the present invention.

[0085] The random testing system based on multi-station serial testing includes at least one testing station and a control unit. At least two test stations perform different routine tests on the chips, and when the number of qualified chips reaches the sampling index, the control unit instructs each of the test stations to perform quality tests on the chips currently undergoing routine tests.

[0086] The control unit can be one or more of an ASIC, a server, and a computer.

[0087] Preferably, the control unit determines the sampling index in the following manner: m=n-a+b. Among them, m represents the sampling index, n represents the number o...

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Abstract

The present invention relates to a random testing method and system based on multi-station serial testing. The method at least includes: when at least two testing stations perform different conventional tests on chips, when the number of qualified chips reaches the random testing index, and Each of the test stations corresponding to the sampling index performs a quality test on the current chip under test. The invention improves the test efficiency of each test station by determining the sampling index and adjusting the quality test data based on the sampling index.

Description

technical field [0001] The invention relates to the technical field of radio frequency chip testing, in particular to a sampling testing method and system based on multi-station serial testing. Background technique [0002] QA is Quality Assurance, quality assurance. In order to improve the accuracy of the test results of the RF chip testing machine, a batch of qualified chips needs to be selected for retesting. If the two test results are the same, it indicates that the test machine test results are accurate. [0003] Existing QA tests are mostly applied to single-station testing and multi-station testing, because the cores of the two are the same, and the test results of the current test chip can be known after the routine testing is completed. The specific performance is that, taking a single-station test as an example, after accumulatively (n-1) chips pass the test, the station routinely tests the nth chip. If the chip passes the test, it can directly continue to do the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2822G01R31/2868
Inventor 胡信伟侯林张宇冯勖顾军李翔张熙瑞乔劲达戴海平吴文超
Owner 南京派格测控科技有限公司