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Ion trap array for high throughput charge detection mass spectrometry

A technology of charge detection and linear ion trap, which is applied in the direction of mass spectrometers, particle separation tubes, parts of particle separator tubes, etc., and can solve problems such as limitations

Pending Publication Date: 2021-04-23
ザトラスティーズオブインディアナユニバーシティー
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, such multiple charge measurements necessarily limit the speed at which ion m / z and charge measurements can be obtained using current ELIT designs

Method used

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  • Ion trap array for high throughput charge detection mass spectrometry
  • Ion trap array for high throughput charge detection mass spectrometry
  • Ion trap array for high throughput charge detection mass spectrometry

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Embodiment Construction

[0026] To promote an understanding of the principles of the disclosure, reference will now be made to the illustrative embodiments shown in the drawings, and specific language will be used to describe these embodiments.

[0027]The present disclosure relates to electrostatic linear ion trap (ELIT) arrays comprising two or more ELITs or ELIT regions and means for controlling the two or more ELITs or ELIT regions such that at least Both operate simultaneously to measure the mass-to-charge ratio and charge of the ions trapped within them. In this way, the rate of ion measurements is increased by a factor of two or more compared to conventional single ELIT systems, and a corresponding reduction in total ion measurement time is achieved. In some embodiments, examples of said embodiments will be referred to below Figures 1 to 4E Described in detail, an ELIT array may be implemented in the form of two or more ELIT regions arranged in series, ie cascaded, and axially aligned. Where...

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PUM

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Abstract

An electrostatic linear ion trap (ELIT) array includes multiple elongated charge detection cylinders arranged end-to-end and each defining an axial passageway extending centrally therethrough, a plurality of ion mirror structures each defining a pair of axially aligned cavities and an axial passageway extending centrally therethrough, wherein a different ion mirror structure is disposed between opposing ends of each cylinder, and front and rear ion mirrors each defining at least one cavity and an axial passageway extending centrally therethrough, the front ion mirror positioned at one end of the arrangement of charge detection cylinders and the rear ion mirror positioned at an opposite end of the arrangement of charge detection cylinders, wherein the axial passageways of the charge detection cylinders, the ion mirror structures, the front ion mirror and the rear ion mirror are coaxial to define a longitudinal axis passing centrally through the ELIT array. In a second aspect, an ELIT array comprises a plurality of non-coaxial ELIT regions, wherein ions are selectively guided into each of the ELIT regions.

Description

[0001] Cross References to Related Applications [0002] This application claims the benefit and priority of U.S. Provisional Patent Application Serial No. 62 / 680,315, filed June 4, 2018, the disclosure of which is incorporated herein by reference in its entirety. [0003] government rights [0004] This invention was made with government support under CHE1531823 awarded by the National Science Foundation. The US Government has certain rights in this invention. technical field [0005] The present disclosure relates generally to charge detection mass spectrometry instruments, and more particularly to performing mass and charge measurements with such instruments. Background technique [0006] Mass spectrometry provides identification of the chemical composition of a substance by separating its gaseous ions according to ion mass and charge. Various instruments and techniques have been developed for determining the mass of such isolated ions, and one such technique is known ...

Claims

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Application Information

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IPC IPC(8): H01J49/42
CPCH01J49/4245H01J49/0031H01J49/022H01J49/025H01J49/406H01J49/426H01J49/0036
Inventor M·F·贾罗德D·博塔曼科
Owner ザトラスティーズオブインディアナユニバーシティー
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