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Method and system for processing Laue diffraction picture

A picture and preprocessing technology, applied in the direction of image data processing, image enhancement, image analysis, etc., can solve the problem of low reliability, achieve the effect of writing simple and accurate data processing methods, and improving calculation accuracy

Inactive Publication Date: 2021-04-30
SHANGHAI JIAO TONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The present invention solves the problem that the reliability of the measurement results of the existing single crystal material stress measurement method is not high

Method used

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  • Method and system for processing Laue diffraction picture
  • Method and system for processing Laue diffraction picture
  • Method and system for processing Laue diffraction picture

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Experimental program
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Effect test

Embodiment 1

[0065] A kind of method of processing Laue diffraction picture provided according to the present invention comprises:

[0066] Step M1: Measure the diffraction observation pattern and the diffraction reference pattern based on the Laue experiment;

[0067] Step M2: Preprocessing the diffraction reference pattern and the diffraction observation pattern to obtain the preprocessed diffraction observation pattern and diffraction reference pattern;

[0068] Step M3: Based on the preset elastic deformation gradient tensor, register the preprocessed diffraction reference pattern and the diffraction observation pattern using the global integrated digital image coherence technology, and obtain the elastic deformation gradient tensor of the diffracted region after registration;

[0069] Step M4: Obtain the elastic stress in the diffracted sample based on the obtained elastic deformation gradient tensor of the diffracted region after registration;

[0070] The Laue diffraction observati...

Embodiment 2

[0108] Embodiment 2 is a modification of embodiment 1

[0109] The present invention relates to the method for extracting sample local stress strain from Laue (Laue) diffraction pattern, such as Figure 7 shown, applicable to all Laue diffraction experiments. The present invention is based on the diffraction pattern (Laue diffraction pattern) measured by Laue experiment, and adopts the global integrated digital image coherence technology (Integrated Digital Image Correlation) to register the reference pattern and the observation pattern. In the registration process, an objective function is set up to characterize the difference between the two types of images. The eight parameters sought are the elastic deviatoric deformation gradient tensor, and the Newton algorithm is used to correct the parameters, and the objective function is gradually reduced to Converge to obtain the local stress-strain of the sample. The invention has the advantages of simple code writing, fast conve...

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Abstract

The invention provides a method and a system for processing a Laue diffraction picture. The method comprises the following steps: step M1, measuring a diffraction observation pattern based on a Laue experiment; step M2, pre-processing the diffraction observation pattern to obtain a pre-processed diffraction observation pattern; step M3, registering the diffraction reference pattern and the preprocessed diffraction observation pattern by adopting a global integrated digital image coherence technology based on a preset elastic deformation gradient tensor to obtain the registered elastic deformation gradient tensor of the diffracted area; step M4, obtaining elastic stress in the diffraction sample based on the obtained elastic deformation gradient tensor of the registered diffracted area. According to the invention, the global integrated digital image coherence technology is combined with the Laue diffraction experiment, so that the precision of measuring local strain and stress by the Laue diffraction experiment is improved.

Description

technical field [0001] The present invention relates to the field of crystalline material characterization and particle diffraction, in particular to a method and system for processing Laue diffraction pictures. Background technique [0002] Particle diffraction techniques include X-ray diffraction, backscattered electron diffraction, neutron diffraction, etc. Various diffraction techniques have been widely used in various engineering materials and academia due to their non-destructive, easy automation, high resolution, high speed and rich observation results. Among them, the Laue technology relies on high-energy X-rays, has high resolution and good transmission performance, and can quickly give information such as grain size and deformation degree. It is a technology widely used in materials, geology and other fields. [0003] In the Laue diffraction technique, high-energy X-rays are converged and injected into the surface of the sample. After complex interactions with the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/2055G06T7/30G06T5/00
CPCG01N23/2055G06T7/30G01N2223/0566G01N2223/1016G01N2223/401G01N2223/604G01N2223/607G06T5/70
Inventor 施奇伟钟鸿儒张丰果钟圣怡陈哲王浩伟
Owner SHANGHAI JIAO TONG UNIV
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