Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Non-digital ray machine sine stripe structured light high-precision three-dimensional measurement device

A technology of sinusoidal fringes and three-dimensional measurement, which is applied in measuring devices, optical devices, image data processing, etc., can solve the problems of low-cost optical three-dimensional imaging systems, low projection frame rate, and large volume, and achieve high-speed and high-precision three-dimensional Imaging, low complexity, high resolution effects

Active Publication Date: 2021-05-07
SICHUAN UNIV +1
View PDF6 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Among them, the three-dimensional measurement technology based on sinusoidal fringe projection can obtain excellent modeling results, but the sinusoidal fringe sequence requires precise phase shift, and commercial digital projection equipment such as DLP (Digital Light Processing) and LCOS (Liquid Crystalon Silicon) are usually used. Low frame rate, large size, and high cost are limited in 3D face recognition applications that need to balance factors such as accuracy, measurement speed, integration, and cost
At present, there is no report of a low-cost high-speed and high-precision structured light 3D imaging system that can meet the requirements of face 3D data acquisition.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Non-digital ray machine sine stripe structured light high-precision three-dimensional measurement device
  • Non-digital ray machine sine stripe structured light high-precision three-dimensional measurement device
  • Non-digital ray machine sine stripe structured light high-precision three-dimensional measurement device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042]The present invention will be further described in connection with examples and specific embodiments. However, it should not be understood that the scope of the above-described above-described above-described embodiments is limited to the following embodiments, and the techniques that are implemented in the present invention are within the scope of the invention.

[0043]figure 1 An aspect three-dimensional measuring device embodiment, which is shown in accordance with the present invention, is shown in a block diagram of a human face object (105) as a measurement target, exemplarily explaining a three-dimensional imaging system (100). And working principle.

[0044]infigure 1 In the three-dimensional imaging system (100) consists of a light field projection device (101), the system control unit (102), the imaging system (103), and the three-dimensional reconstruction algorithm module (104). The light field projection device (101) and the imaging system (103) have a stereoscopic tri...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the field of optical three-dimensional imaging, in particular to a non-digital optical machine sine stripe structured light high-precision three-dimensional measuring device. A structured light field projection device comprises N structured light projection modules, a light combination prism and a projection lens group; the structured light projection modules are sequentially started according to a preset time sequence to generate N sine stripe structured light fields; the light combination prism is used for performing light path conversion on the N sine stripe structure light fields and outputting the light fields to the projection lens group; the projection lens group is used for projecting the N sine stripe structured light fields to the same target to be measured; when the N sine stripe structure light fields are projected to the same target to be measured, the N sine stripe structure light fields have the same imaging position, and a 2pi / N space phase interval exists between the adjacent sine stripe structure light fields in the time sequence. With the structured light field projection device and a three-dimensional imaging system provided by the invention adopted, the three-dimensional data of a face target can be obtained at high speed and high precision.

Description

Technical field[0001]The present invention relates to the field of optical three-dimensional imaging, and more particularly to a high-precision three-dimensional measuring device for non-digital optical striped structural light.Background technique[0002]The premise of the fast-moving application of the three-dimensional face recognition technology is the establishment of the large-scale three-dimensional face data. The optical 3D measurement technology based on the triangular measurement principle has a significant advantage of non-contact, high precision and fast speed, and is considered to obtain high speed. One of the technologies of high-precision three-dimensional face data. The principle of optically 3D measurement is obtained as: projection structural light field to the surface of the face to be tested, and use a single-graph or two-point camera to shoot a deformation image sequence that is modulated by the face surface of the human face to be tested. The image sequence extra...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25G06K9/00G06T17/00
CPCG01B11/25G01B11/2513G01B11/254G06T17/00G06V40/168
Inventor 游志胜朱江平程鹏周佩张自力
Owner SICHUAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products