Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Depth sensing device and method

A technology of depth sensing and light sensor, which is applied in measuring devices, radio wave measuring systems, electromagnetic wave re-radiation, etc., can solve the problem of increased volume and cost, difficulty in obtaining resolution, and influence on the light uniformity of structured light patterns, etc. question

Pending Publication Date: 2021-05-14
OPUS MICROSYSTEMS SHENZHEN
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, the above-mentioned products need to include two different light-emitting components to generate structured light patterns and laser light for time-of-flight distance measurement respectively, so their volume and cost will increase
In addition, when the generated structured light pattern is a static speckle pattern, it is difficult to obtain better resolution due to the limitation that the speckle pattern element needs to be manufactured with a nanometer process technology that reaches the wavelength level of laser light; and the The generated laser light has a limited working distance due to energy divergence
Furthermore, this product usually uses a diffractive optical element (DOE) to generate a static structured light pattern, but if the process quality of the diffractive optical element is not good, it will easily affect the light uniformity of the structured light pattern, resulting in resolution bad

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Depth sensing device and method
  • Depth sensing device and method
  • Depth sensing device and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0054] Specific embodiments according to the present invention will be described in detail below; however, without departing from the spirit of the present invention, the present invention can still be practiced in various forms of embodiments, and the scope of protection of the present invention should not be interpreted as being limited to those described in the description. declarant. In addition, the technical content of each implementation aspect in the above summary of the invention can also be used as the technical content of the embodiment, or as a possible variation of the embodiment. In addition, unless the context clearly indicates otherwise, the singular form "a" used herein also includes plural forms. When the word "comprises" or "comprises" is used in this specification, it is used to indicate the existence of features, elements or components, etc. , does not exclude the existence or addition of one or more other features, elements or components. In addition, th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A depth sensing device and method are provided. The device includes a light emitting component, a light receiving component, and a control unit. The light emitting assembly comprises a laser light source and a galvanometer, the laser light source comprises a single specific wavelength light source or a plurality of sub light sources, and the laser light source emits laser light towards the galvanometer so that the laser light can be projected to an object to be measured. The light receiving assembly is optically coupled with the light emitting assembly so as to receive reflected light of the laser light reflected from the object to be measured; the control unit is electrically connected with the light emitting assembly and the light receiving assembly, and controls the light emitting assembly and the light receiving assembly according to a structured light mode and / or a laser radar mode. The method includes performing the laser radar mode and / or the structured light mode. Therefore, the laser radar mode and / or the structured light mode can be selected according to the distance of the to-be-measured object to sense the depth of the to-be-measured object.

Description

technical field [0001] The present invention relates to sensing devices and methods, in particular to object depth sensing devices and methods. Background technique [0002] In applications such as face recognition, gesture recognition, object and environment modeling, etc., depth sensing devices are used to sense the position and depth information of objects and environments to obtain corresponding point cloud data, thereby establishing objects and environments 3D model of . [0003] The depth sensing technology used in this device can be divided into three types: Stereo vision (Stereo vision), Structured Light (Structured Light) and Time of Flight (TOF), each technology has its own advantages and disadvantages . For example, the advantage of stereo vision is that the hardware cost is low, but it is easy to be affected by ambient light and affect the depth accuracy of the measurement; the advantage of structured light is that it can obtain better depth accuracy, but it is...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01S17/08G01S7/481
CPCG01S7/4814G01S7/4817G01S17/08
Inventor 洪昌黎郭柏辰
Owner OPUS MICROSYSTEMS SHENZHEN
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products