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Semi-automatic chip testing system

A test system and semi-automatic technology, applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve problems affecting test efficiency, etc., and achieve the effect of improving test efficiency, satisfying small batch testing tasks, and improving chip testing efficiency.

Active Publication Date: 2021-05-25
CHENGDU HAIGUANG INTEGRATED CIRCUIT DESIGN CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If testing in the laboratory, use the test board and the manual test cover, each time you need to manually adjust the contact pressure between the manual test cover and the chip on the test board to fix the chip, which affects the test efficiency

Method used

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  • Semi-automatic chip testing system
  • Semi-automatic chip testing system
  • Semi-automatic chip testing system

Examples

Experimental program
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Embodiment 1

[0024] figure 1 It is a schematic structural diagram of an embodiment of a chip semi-automatic testing system of the present invention; see figure 1 As shown, the chip semi-automatic testing system provided by the embodiment of the present invention may include: a test bench 100, and the whole test bench 100 may be a rectangular parallelepiped or a square structure.

[0025] The test bench 100 includes: a bench 110 and a first guide rail 111 which is movably arranged on the bench 110 in the horizontal direction, and a temperature control device which can move horizontally and vertically is arranged on the first guide rail 111 . The indenter 120 is provided with a test board 130 on the platform 110 and below the temperature-controlled indenter 120 , and the test board 130 has a chip mounting portion 131 .

[0026] Wherein, the stand 110 is a cuboid or cube frame structure; specifically, it can be made of common steel, stainless steel and other profiles, and can also be made of...

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PUM

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Abstract

The embodiment of the invention discloses a semi-automatic chip testing system, relates to the technical field of semiconductor packaging testing, the system is convenient for improving the chip testing efficiency in a laboratory, and can meet small-batch testing tasks. The testing system includes a test board, the test board comprises a rack and a first guide rail movably arranged on the rack in the horizontal direction, a temperature control pressure head capable of moving transversely and vertically is arranged on the first guide rail, a test single board is arranged on the rack and located below the temperature control pressure head, and the test single board is provided with a chip installation part. The system is suitable for chip performance testing.

Description

technical field [0001] The invention relates to the technical field of semiconductor packaging and testing, in particular to a chip semi-automatic testing system. Background technique [0002] In mass-production semiconductor packaging and testing factories, in order to ensure mass testing of chips, more than 95% of them use large-scale fully automatic test Handler equipment for testing, and some testing conditions such as laboratory space, electricity, compressed air, and process cooling water are limited. Under these conditions, it is impossible to use mass-produced Handler devices to meet product system test and development requirements. [0003] At present, in the laboratory, the mainstream method is to use the test board and the manual test cover to conduct manual tests. When there are small batches of special test tasks, if they are tested on the mass production line of the packaging and testing factory, the time and process of setting up the hardware test environment...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2849
Inventor 辅俊海顾向前桂晓峰吕娅徐宏思
Owner CHENGDU HAIGUANG INTEGRATED CIRCUIT DESIGN CO LTD