Unlock instant, AI-driven research and patent intelligence for your innovation.

A semiconductor manufacturing method

A manufacturing method and semiconductor technology, applied in the direction of semiconductor lasers, laser components, electrical components, etc., can solve the problems of monitoring and characterizing materials, and achieve the effect of low loss and reliability

Active Publication Date: 2021-08-24
GUILIN LASERCOM TECH CO LTD
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, with SAG technology, the BFS must be formed on the unmodified epi region, while the laser must be formed on the modified epi region
Therefore, it is difficult to monitor and characterize materials used in laser components by SAG techniques

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A semiconductor manufacturing method
  • A semiconductor manufacturing method
  • A semiconductor manufacturing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037]This embodiment provides a semiconductor manufacturing method for growing quantum wells with different layer thicknesses in the same plane during a single semiconductor epitaxial deposition process. First, a viaduct structure is formed on the region that needs to be modified, such as image 3 shown. The epitaxial layer under the bridge structure is thinner than the epitaxial layer outside the bridge structure due to reduced gas source diffusion under the bridge structure. Therefore, this technique results in a negative layer epitaxy rate in the modified region compared to the unmodified region, as Figure 4 As shown in (a)-(c), the inventors call this technology Selective Depletion Epitaxy SDE.

[0038] This embodiment relates to a wafer manufacturing method for growing quantum wells with different layer thicknesses in the same plane during a single semiconductor epitaxial deposition process, comprising the following steps:

[0039] Step 1, see figure 2 , implement t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a semiconductor manufacturing method, in which quantum wells with different layer thicknesses are grown in the same plane in a single semiconductor epitaxial deposition process, comprising the following steps: performing the first layer epitaxy to grow a basic epitaxial layer structure, the basic epitaxial layer The structure includes a substrate, a sacrificial layer and a bridging layer, the sacrificial layer is located between the substrate and the bridging layer; the bridge pattern is formed by photolithography and etching, and a wafer with patterned bridgehead overhangs is formed; the wafer is cleaned; the cleaned Wafers with patterned bridgehead overhangs are sent back to the epitaxy facility for a second layer of epitaxy; portions of the viaduct structures are selectively removed, resulting in wafers with epitaxial layers of different thicknesses in different regions. The corresponding laser integrated structure manufacturing method and the laser integrated structure manufactured thereby are also provided. When this optical mode exits the integrated device through the beamforming section, the resulting far-field pattern is narrower, which facilitates the optical coupling of the device into an optical fiber and the reliability of the device.

Description

technical field [0001] The invention relates to the field of semiconductor components and chips, in particular to a semiconductor manufacturing method for growing quantum wells with different layer thicknesses in the same plane during a single semiconductor epitaxial deposition process. Background technique [0002] In opto-semiconductor integrated structures, optical modes must be able to propagate along the horizontal planar waveguide from one part to another part with different properties with minimal loss. Generally, epitaxy can complete parts with different properties on the plane with multiple growths, but the cost is high, and the height of waveguides with different properties needs to be strictly controlled. Techniques capable of growing cross-sections with multiple portions of different properties in a single epitaxial growth would be beneficial in reducing cost and complexity and need to be developed and investigated. [0003] Existing techniques such as so-called...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01S5/34H01S5/026
CPCH01S5/026H01S5/34
Inventor 陈伯庄
Owner GUILIN LASERCOM TECH CO LTD