High-precision ADC acquisition control system suitable for double-MCU hardware architecture

Abstract

The invention discloses a high-precision ADC acquisition control system suitable for a double-MCU hardware architecture. The system is characterized in that a starting ADC module is connected with an alternating current plug-in module through a first conditioning module; a protection ADC module is connected with the AC plug-in module through a second conditioning module; the first conditioning module and the second conditioning module respectively receive a plurality of AC voltage analog quantity signals transmitted by the AC plug-in module, carry out data processing on the AC voltage analog quantity signals and then respectively transmit the AC voltage analog quantity signals to the protection ADC module and the starting ADC module; if the output signals of the starting ADC module and the protection ADC module are consistent, a device is allowed to send out a relay protection action instruction, and if the output signals are not consistent, latching protection is carried out. Through the on-chip double-ADC analog quantity acquisition design formed by double MCU platforms, the analog quantity acquisition accuracy is improved, and the serious problems of relay protection maloperation or operation refusal and the like caused by single-ADC analog acquisition errors are avoided.

Description

technical field [0001] The invention relates to the field of relay protection control of electric equipment, in particular to a high-precision ADC acquisition control system suitable for dual-MCU hardware architecture. Background technique [0002] At present, the analog signal is an important data basis for relay protection logic judgment, and its accuracy determines the performance of the protection device. In the prior art, the ADC module is integrated in the MCU chip, and the sampling resolution is 12 bits, which cannot meet the sampling accuracy requirements of the product in the specification of the relay protection device. In addition, the ADC chip has a general problem: the signal-to-noise ratio is small, and the effective bits are few, resulting in a large resolution LSB and low sampling accuracy. At the same time, the ADC chip also has the problem of poor electromagnetic compatibility. During high temperature and fast transient tests, the analog acquisition accura...

AI Technical Summary

Problems solved by technology

In the existing technology, the ADC module is integrated in the MCU chip, and the sampling resolution is 12 bits, which cannot meet the sampling accuracy requirements of the product in the relay protection device specification

In addition, the ADC chip has a general problem: the signal-to-noise ratio is small and the effective bits are few, resulting in a large resolution LSB and low sampling accuracy

At the same time, the ADC chip also has the problem of poor electromagnetic compatibility. During high temperature and fast transient tests, the analog acquisition accuracy does not meet the analog accuracy requirements specified in the standard.

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