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A dual-axis in-situ measurement system and method for electron polarizability of a serf atomic magnetometer

A technology of electron polarization and atomic magnetism, which is applied to the size/direction of the magnetic field, and the use of magneto-optical equipment for magnetic field measurement. , to achieve the effect of reducing the impact

Active Publication Date: 2022-04-19
BEIHANG UNIV
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

At present, the commonly used alkali metal electron polarizability measurement devices are based on the SERF atomic magnetometer SERF atomic magnetometer, which is difficult to use due to the use of near-resonant light to pump the alkali metal atoms, and the pumping light is almost completely absorbed by the alkali metal Pump light information measurement of electron polarizability in the direction of the pump axis
In addition, the commonly used alkali metal electronic polarizability measurement methods generally can only measure uniaxial electronic polarizability information, and cannot simultaneously measure biaxial electronic polarizability information.

Method used

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  • A dual-axis in-situ measurement system and method for electron polarizability of a serf atomic magnetometer
  • A dual-axis in-situ measurement system and method for electron polarizability of a serf atomic magnetometer
  • A dual-axis in-situ measurement system and method for electron polarizability of a serf atomic magnetometer

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Embodiment Construction

[0032] Below with the accompanying drawings ( Figure 1-Figure 2 ) and Examples illustrate the present invention.

[0033] figure 1 It is a structural schematic diagram of a dual-axis in-situ measurement system for electronic polarizability of a SERF atomic magnetometer which implements the present invention. figure 2 It is a schematic flow chart of implementing a dual-axis in-situ measurement method for electronic polarizability of a SERF atomic magnetometer of the present invention. refer to Figure 1 to Figure 2 Shown, the electronic polarizability biaxial in-situ measurement system of a kind of SERF atomic magnetometer SERF atomic magnetometer comprises detection laser module 28 and pumping laser module 27, is set in described detection laser module 28 and will detect The laser light emitted by the laser 1 is divided into two first polarization beam splitter prisms 3, wherein the first detection laser beam passes through the alkali metal gas chamber 21 along the X axis...

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Abstract

A dual-axis in-situ measurement system and method for electronic polarizability of a SERF atomic magnetometer, by setting a first polarization beam splitter prism in the detection laser module that splits the laser light emitted by the detection laser into two, wherein the first beam detection The laser passes through the alkali metal gas chamber along the X axis to measure the polarizability information of the detection axis electrons. The second detection laser beam is coupled with the pumping light formed by the pumping laser module and then passes through the alkali metal gas chamber along the Z axis to measure the pumping axis electrons. Polarizability information, the electronic polarizability Px of the detection axis is measured in situ by measuring the optical rotation angle θx in the X-axis direction, and the electronic polarizability Pz of the pumping axis is realized by measuring the optical rotation angle θz in the Z-axis direction The in-situ measurement is beneficial to complete the online measurement of the biaxial polarizability of alkali metal electrons when the SERF atomic magnetometer is working normally, and improves the measurement efficiency.

Description

technical field [0001] The invention relates to SERF atomic magnetometer measurement technology, in particular to a SERF atomic magnetometer SERF atomic magnetometer electronic polarizability dual-axis in-situ measurement system and method, by setting the detection laser module in the detection laser module to emit The laser beam is divided into two by the first polarization beam splitter prism, wherein the first detection laser beam passes through the alkali metal gas chamber along the X axis (detection axis) to measure the electronic polarizability information of the detection axis, the second detection laser beam and the pumping laser The pumping light formed by the module is coupled and passes through the alkali metal gas chamber along the Z axis (pumping axis) to measure the electronic polarizability information of the pumping axis. The measurement of θx realizes the in-situ measurement, and the pumping axis electronic polarizability Pz realizes the in-situ measurement by...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R33/032
CPCG01R33/032
Inventor 陆吉玺马彦宁杨可翟跃阳韩邦成
Owner BEIHANG UNIV